[:es] Organizado por: Fecha: Miércoles 15 de Noviembre 2017 Hora: 9.30 – 16.30 Lugar: Imdea Materiales Un año más hemos preparado un encuentro para todos los investigadores que están trabajando en el campo de las propiedades…
[:es] Regístrese hoy para nuestra presentación webinar sobre espectroscopia Raman La microscopía y la obtención de imágenes Raman están demostrando ser una valiosa técnica para la caracterización de grafenos, biomateriales y otras nanotecnologías encontradas en la investigación de ciencias de…
[:en] Film Thickness Measurements are one of the most challenging and critical metrics in any coating process. Destructive testing can be used to measure the thickness of a film from a cross-section, however (besides the undesirability of a broken product),…
[:en] » Zoom zoom: High speed AFM imagin C Parmenter on 06 February, 2017. Related links: Most popular Trending M&A blog posts 1 The Focused Ion Beam – All Grown Up? 2 Is your sample preparation holding…
[:en] » Published on February 6, 2017 at 4:23 AM Written by AZoNanoFeb 6 2017 Oxford Instruments Asylum Research announces the new Cypher VRS Video-Rate AFM, the first and only full-featured video-rate atomic force microscope (AFM). The Cypher VRS…
[:en] «The PBS Nova Show Treasures of the Earth: Power has featured the Zeta-20 Optical Profiler and Zeta Wafers. Solar energy possibilities are now being mined around the world. Over the last five years the number of solar panels has…
«Oxford Instruments Asylum Research announces the availability of the new Electrochemistry Cell for studying electrochemical reactions in situ, including processes such as deposition, oxidation, corrosion and mass transfer of metals and other materials at the nanoscale. “The Electrochemistry…
[:en] New innovations transform the Transmission Electron Microscope (TEM) from a simple high-resolution image acquisition tool into a nanoscale materials research and development laboratory. Better understand material behavior by analyzing samples in real-world gas or liquid environments, at high temperature…
[:es] La microscopía de barrido electrónico (SEM) se utiliza de forma convencional en diversos campos de la industria y la ciencia debido a que es una de las técnicas de imagen más versátiles. Los SEMs permiten a los usuarios visualizar…