[:es]
Synthesis of carbon nano-onions doped with nitrogen using spray pyrolisis
E Tovar-Martinez, JA Moreno-Torres… – Carbon, 2018
… The XRD measurements were obtained at room temperature with a step of
0.01° in a range of 35–70°. XPS measurements were performed with the
PHI5000 VersaProbe II using a monochromatic Al-Ka X-ray beam. 2.3 …
H Gao, F Wu, X Wang, C Hao, C Ge – International Journal of Hydrogen Energy, 2018
… X-ray photoelectron spectroscopy (XPS, PHI 5000 VersaProbe) was performed to analyze
valence states and chemical compositions of products. Crystallite morphologies were
examined by field emission scanning electron microscope (FESEM, JSM-7800F) …
Complete detoxification reaction by NO reduction with CO over nano‐sized copper‐substituted Cr2O3
RD Kerkar, MS Fal Desai, AV Salker – Surface and Interface Analysis, 2018
… respectively. Energy‐dispersive spectroscopy was used to determine the elemental
composition (JEOL Model JED‐2300). X‐ray photoelectron spectros- copy (XPS)
was carried out on PHI 5000 versa probe II instrument. H2 …
Photovoltaic Action With Broadband Photoresponsivity in Germanium-MoS₂ Ultrathin Heterojunction
RD Mahyavanshi, G Kalita, A Ranade, P Desai… – IEEE Transactions on …, 2018
… SEM study was done using JEOL JSM 5600 with an accelerating voltage
of 20 kV. XPS characterization was performed by Versa probe using
monochromated Al Kα excitation source (1486.6 eV). AFM studies were …
Morphology and Crystal-Plane Effects of CeO2 on TiO2/CeO2 Catalysts during NH3-SCR Reaction
X Yao, L Chen, J Cao, F Yang, W Tan, L Dong – Industrial & Engineering Chemistry …, 2018
… temperature. X-ray photoelectron spectroscopy (XPS) tests were performed
on the PHI 5000 VersaProbe system equipped monochromatic Al-Kα source
(1486.6 eV). Before the test, each sample was pretreated in the UHV chamber …
Y Wu, M Yan, L Sun, W Shi – New Journal of Chemistry, 2018
… patterns. X-ray photo-electron spectroscopy (XPS) was performed on a PHI5000 Versa
Probe electron spectrometer with the Al Kα source operated (ULVAC-PHI, Japan). The
morphologies of the samples were obtained by scanning electron …
P Shandilya, D Mittal, M Kumar, P Raizada… – Journal of Cleaner …, 2018
… X-ray photoelectron spectroscopy (XPS) was performed on a PHI VersaProbe II with AES
using 24.63 W Al Kα radiation. Scanning electron microscopy (SEM) measurements were
performed using model Nava Nano SEM-45 (USA) system …
J Miao, X Duan, J Li, J Dai, B Liu, S Wang, W Zhou… – Chemical Engineering …, 2018
… magnetometer (VSM, Squid). An X-ray photoelectron spectrometer (XPS, PHI5000
VersaProbe) using Al-Kα as an X-ray source was used to examine surface metallic
oxidation states and elemental compositions. The oxygen …
Enhanced Low Frequency Electromagnetic Properties of MOF-derived Cobalt through Interface Design
W Liu, S Tan, Z Yang, G Ji – ACS Applied Materials & Interfaces, 2018
… spectrometer (ICP-AES). Before test, samples were thoroughly treated
in aqua regia. Chemical state of each element was evaluated by a PHI
5000 VersaProbe device. A Lakeshore 7400 vibration magnetometer …
Co-deoxy-liquefaction of willow leaves and waste tires for high-caloric fuel production
W Lu, Y Guo, B Zhang – Journal of Analytical and Applied Pyrolysis, 2018
… The compositions of char were detected by a PHI VersaProbe X-ray photoelectron
spectroscopy (XPS) in an ultrahigh vacuum chamber (1 × 10 6 mmHg). The energy
pass was 100.0 eV, and the energy step was set at 1.0 eV …
Entrapment of polysulfides by Al2O3 modified separator for high energy Li–S redox flow batteries
D Yan, Y Huang, C Fan, X Wang, J Yan, H Lin, D Jia… – Journal of Alloys and …, 2018
… The X-ray photoelectron spectroscopy (XPS, PHI 5000 Versa Probe) of
the PP-Al 2 O 3 separator was investigated. The samples were
characterized by N 2 adsorption-desorption isotherms using a volumetric …
SP Vibhute, PM Mhaldar, SN Korade, DS Gaikwad… – Tetrahedron Letters, 2018
… Magnetic properties of the sample was analyzed by using the Vibrating Sample
Magnetometer (VSM) lakeshore 7410, Oxidation state of Copper determined by X-ray
Photoelectron Spectroscopy PHI 5000 Versa Probe-II. Preparation of Catalyst …
Mesoporous NiCoPx nanoplates as highly efficient electrocatalysts for overall water splitting
JJ Lv, S Wu, M Qiao, LL Li, JJ Zhu – Journal of Power Sources, 2018
… respectively. The X-ray photoelectron spectra (XPS) were measured on a PHI 5000
VersaProbe (Ulvac-Phi, Japan). The Brunauer−Emmett−Teller (BET) surface area
was tested by a Micrometrics ASAP2020 analyzer (USA) …
[PDF] Modernizing the nation’s stockpile: Plutonium Surface Science Lab
HK Fronzak, KE Kippen – 2018
… X-ray photoelectron spectrometer Researchers investigate the chemistry of the top
few nano- meters of a solid sample surface with a Physical Electron- ics VersaProbe
III, which defines the chemistry and reac- tivity of a given surface …
HS Na, JO Shim, SY Ahn, WJ Jang, KW Jeon, HM Kim… – International Journal of …, 2018
… X-ray photoelectron spectroscopy (XPS) profiles were recorded on a PHI
5000 VersaProbe (ULVAC PHI) spectrometer, employing monochromatic
Al Kα radiation (1486.6 eV). Raman spectra were collected using a Renishaw …
JQ Chen, Z Zhang, K Pei, Q Yang, J Dong, Z Yan – New Journal of Chemistry, 2018
… View Article Online DOI: 10.1039/C8NJ03159B Page 5. 4 PHI 5000
Versaprobe XPS instrument (PHI, Japan) with a monochromic Al Ka
source (150 W, 15 kV, 1486.7 eV) under vacuum pressure. Confocal …
Core-shell nanostructured CS/MoS2: a promising material for Microwave absorption
F Zhang, W Zhang, W Zhu, B Cheng, H Qiu, S Qi – Applied Surface Science, 2018
… voltage of 200 kV. The crystalline structure was characterized by an XRD (Bruker
D8) with a 2θ scope of 10-80 °. XPS was carried out on a PHI (5000 Versa Probe)
equipped with an Al Ka X-ray source. The EM parameters were …
Properties of zinc coatings electrochemically passivated in sodium molybdate
N Akulich, N Ivanova, I Zharskii, M Jönsson‐Niedziółka – Surface and Interface …, 2018
… spectroscopy (XPS). XPS studies were carried out on a scanning photoelectronic
spectrometer PHI 5000 VersaProbe (Physical Electronics, USA). A monochromatic
X‐ray source Al‐Ka = 1486.6 eV (14.5 kV, 20 mA) was used. To …
Oxygen and nitrogen co-doped porous carbon granules enabling dendrite-free lithium metal anode
Y Liu, X Qin, S Zhang, Y Huang, F Kang, G Chen, B Li – Energy Storage Materials, 2018
… X-ray photoelectron spectroscopy (XPS) was collected on PHI 5000 VersaProbe II with
Al K_α irradiation (1486.6 eV). 3. Results and discussion. The SEM images of PAN-based
CGs and resulted ONPCGs were illustrated in Fig. S1 to characterize their morphologies …
Size modulated Griffiths phase and spin dynamics in double perovskite Sm1. 5Ca0. 5CoMnO6
RC Sahoo, S Das, SK Giri, D Paladhi, TK Nath – Journal of Magnetism and Magnetic …, 2018
… JEM2100 with a resolution of 1.9 Å). Electronic structure of the sample has been
determined using X-ray photoelectron spectroscopy (XPS, PHI 5000 Versa Probe
II Scanning). The magnetization measurements have been carried …
Activating abnormal capacity in stoichiometric NaVO3 as cathode material for sodium-ion battery
J Zhang, B Su, A Kitajou, M Fujita, Y Cui, M Oda… – Journal of Power Sources, 2018
… Morphologies of samples were observed with scanning electron
microscopy (SEM, Quanta 200, FEI). X-ray photoelectron spectroscopy
(XPS) was carried out on a PHI 5000 VersaProbe II spectrometer using …
Nitrogen-doped carbon nanomaterials as highly active and specific peroxidase mimics
Y Hu, XJ Gao, Y Zhu, F Muhammad, S Tan, W Cao… – Chemistry of Materials, 2018
… Scanning electron microscopy (SEM) images were recorded on a Zeiss Ultra 55
microscope (Zeiss, Germany). X-ray photoe- lectron spectroscopy (XPS) spectra were
collected by a PHI 5000 VersaProbe XPS microscope (UlVAC-PHI, Japan) …
L Ma, X Gao, W Zhang, H Yuan, Y Hu, G Zhu, R Chen… – Nano Energy, 2018
… EPR measurements were performed on a Bruker EMX-10/12 spectrometer
equipped with a cylindrical cavity operating at a 100 kHz field modulation
at 77 K. X-ray photoelectron spectra (XPS) were conducted on a PHI-5000 …
W Cao, F Muhammad, Y Cheng, M Zhou, Q Wang… – ACS Applied Bio Materials, 2018
… The X-ray photoelectron spectroscopy (XPS) results were obtained by using PHI 5000
VersaProbe. Dynamic lighting scattering (DLS) and zeta potential distribution were
measured on Nanosizer ZS90 (Malvern) using deionized water as dispersants …
Catalytic HCl Oxidation Reaction: Stabilizing Effect of Zr-Doping on CeO2 Nano-Rods
C Li, Y Sun, F Hess, I Djerdj, J Sann, P Voepel, P Cop… – Applied Catalysis B …, 2018
… X-ray photoemission spectroscopy (XPS) experiments (PHI VersaProbe II)
were performed with a photon energy of 1486.6 eV (monochromatized
Al-K α line) and an x-ray spot size of ~200 µm with an excitation power of …
Self-healing improves the stability and safety of polymer bonded explosives
X Huang, Z Huang, JC Lai, L Li, GC Yang, CH Li – Composites Science and …, 2018
… Each spectrum was captured by averaging 32 scans at a resolution of 2 cm −1 . The surface
elemental compositions of different samples were determined by XPS analysis (PHI 5000
Versa Probe, UlVAC-PHI Company, Japan). 2.5. Glass transition temperature measurement …
D Vyas, A Singhal – Journal of Physics and Chemistry of Solids, 2018
… model Jeol JEM1400 Plus. X-ray photoelectron spectroscopic studies were done
to check elemental compositions and their valence states by using Model/Supplier:
PHI 5000 Versa Probe II, FEI Inc. Thermal property (TG-DTA …
S Xu, Q Zhu, T Chen, W Chen, J Ye, J Huang – Materials Chemistry and Physics, 2018
… X-ray photoelectron spectrum (XPS) analysis was performed on a PHI 5000 Versaprobe
system using monochromatic Al Kα radiation (1486.6 eV). All binding energies were
referenced to the C 1s peak at 284.6 eV. 2.3. Electrochemical measurements …
X Liu, J Wang, Y Dong, H Li, Y Xia, H Wang – Materials Science in Semiconductor …, 2018
… Raman spectra of the samples were analyzed using an invia Raman spectrophotometer
(Renishaw Ltd, United kingdom). The surface electronic state of the sample was analyzed
by Versa Probe PHI 5000 X-ray photoelectron spectroscopy (XPS) (Ulvac-PHI, INC. Japan) …
Remote epitaxy of copper on sapphire through monolayer graphene buffer
Z Lu, X Sun, WY Xue, A Littlejohn, GC Wang, S Zhang… – Nanotechnology, 2018
… chemical species. The substrate surfaces were cleaned with the same
4-step wet chemical procedures as described above. The XPS experiment
was conducted in a Versaprobe system from Physical Electronics (PHI) …
Iron impregnated biochars as heterogeneous Fenton catalyst for the degradation of acid red 1 dye
KK Rubeena, PHP Reddy, AR Laiju, PV Nidheesh – Journal of Environmental …, 2018
… Spectroscopy) analysis was done using X-ray beam induced secondary
electron imaging and measurements were taken with a monochromatic
Al Kα radiation source of 1486.6eV with a step size of 0.05eV using Physical …
[PDF] Connected AZO Nanorods for Sensitivity Enhancement of Chemical Sensors at Room Temperature
D Kumar, Z Pei – 2018
… Hall Effect measurements technique (Napson, RT70/RG-5, Japan)
ensured the electrical characterization of the film. Further chemical
analysis, was analyzed by XPS, (ULVAC-PHI PHI 5000 VersaProbe …
Corrosion-and Wear-Resistant Pulse Reverse Current (PRC)-Based Electrodeposited Ni-W Coating
DD Shreeram, V Bedekar, S Li, H Cong, GL Doll – JOM, 2018
… troscopy (EDS). Surface and bulk compositional analysis was performed using a PHI
VersaProbe II scanning x-ray photoelectron spectrometer (XPS) equipped with a
monochromatic (Al Ka) x-ray beam (E = 1486 eV). XPS determination …
[HTML] Hierarchical Co–FeS 2/CoS 2 heterostructures as a superior bifunctional electrocatalyst
K Wang, W Guo, S Yan, H Song, Y Shi – RSC Advances, 2018
… of 200 kV. The chemical compositions of samples were determined by using X-ray
photoelectron spectroscopy (XPS) analysis (PHI5000 Versaprobe). 2.4
Electrochemical measurements. Electrochemical measurements were …
YJ Ko, K Choi, S Lee, KW Jung, S Hong, H Mizuseki… – Water Research, 2018
… The sample was heated from 50 °C to 200 °C. The surface chemistry of the PPy samples
was studied by Fourier transform infrared spectroscopy (FT-IR, Bruker-Tensor) and
X-ray photoelectron spectroscopy (XPS, Ulvac Co., PHI 5000 Versaprobe) …
N Islam, S Wang, J Warzywoda, Z Fan – Journal of Power Sources, 2018
… out using a Bruker Optics SENTERRA dispersive Raman microscope
spectrometer with an excitation laser of 532 nm, and a spectral resolution
of ∼ 3–5 cm −1 . X-ray photoelectron spectroscopy (XPS) data were acquired …
S Ghosh, H Remita, RN Basu – Applied Catalysis B: Environmental, 2018
… For XPS study, ZnO and PDPB-ZnO samples were prepared in pallet form and the analysis
was carried out in a PHI 5000 VersaProbe II spectrophotometer (Physical Electronics
Inc., USA) using a monochromatized Al K α (~1486.6 eV) X-ray beam of size ~ 100 µm …
H Cho, W Cho, Y Kim, J Lee, JH Kim – RSC Advances, 2018
… DektakXT Stylus Profiler, Bruker). The work function was obtained through UV
photoelectron spectroscopy (UPS; PHI 5000 Versa Probe II, Ulvac-PHI) of thin films
on indium tin oxide (ITO) substrates. Transmittance, haziness, and …
X Jin, Q Xia, J Ding, J Shen, C Yang, RV Chaudhari – Industrial & Engineering …, 2018
… identify element distribution in selected region, which is similar to previously
described.40,41 The specifics have also been described in our recent
work. X-ray photoelectron spectroscopy (XPS): Instrument: PHI 5000 Versa …
L Melo-Máximo, J Lin, AE Murillo, O Salas… – Thin Solid Films, 2018
… 1 Hz. For XPS, an ultra-high vacuum (UHV) Scanning XPS microprobe PHI 5000
VersaProbe II from Physical Electronics was used. An Al K X-ray source (hν = 1486.6
eV) was applied at 25 W and with an MCD analyzer. At 45 …
K Yang, YAN Yu, W Haiyang, SUN Zhixuan, C Wen… – Nanoscale, 2018
… X-ray photoelectron spectrometer (XPS) were recorded on a PHI5000 Versaprobe system
using Page 2 of 10 Nanoscale Nanoscale Accepted Manuscript Published on 14 August
2018. Downloaded by google on 8/15/2018 6:30:45 PM …
L Ma, G Zhu, W Zhang, P Zhao, Y Hu, Y Wang, L Wang… – Nano Research
… spectrometer using a 473 nm laser source. X-ray photoelectron spectroscopy (XPS)
measurements were performed on a PHI-5000 VersaProbe spectrometer using Al
Kα X-ray radiation. Contact angles were determined with a …
L Hu, XF Song, SL Zhang, HB Zeng, XJ Zhang… – Journal of Catalysis, 2018
… force microscopy. The electronic structures were performed with ultraviolet
photoemission spectroscopy (UPS, PHI 5000 VersaProbe III) with a monochromatic
He I light source (21.2 eV) and a VG Scienta R4000 analyzer. A …
Giant dielectric permittivity and dielectric relaxation behaviour in (Fe1/2Nb1/2) xTi1-xO2 ceramics
T Nachaithong, W Tuichai, P Moontragoon, N Chanlek… – Ceramics International, 2018
… The sintered FNTO ceramics were characterized by X−ray diffraction technique
(XRD, PANalytical, EMPYREAN), scanning electron microscope (SEM,
SNE4500M) and X−ray photoelectron spectroscopy (XPS, PHI5000 Versa …
Electronic structure of colossal permittivity (Mg1/3Nb2/3) 0.05 Ti0. 95O2 ceramics
N Thongyong, P Srepusharawoot, W Tuichai… – Ceramics International, 2018
… The sintered MNTO ceramic was characterized by X−ray diffraction technique
(XRD, PANalytical, EMPYREAN), scanning electron microscope (SEM,
SNE4500M), and X−ray photoelectron spectroscopy (XPS, PHI5000 Versa …
H Fan, K Mao, M Liu, Z Ou, Q Wu, R Che, L Yang, Q Wu… – Journal of Materials …, 2018
… electron microscopy (TEM, JEM-2100F operating at 200 kV, equipped with
the high- angle annular dark field-scanning TEM (HAADF-STEM) and electron
energy-loss spectroscopy (EELS)), X-ray photoelectron spectroscopy (XPS …
Y Cao, L Zhao, T Gutmann, Y Xu, L Dong… – The Journal of Physical …, 2018
… The Raman spectra were recorded with an excitation wavelength of 514
nm and a laser power of 300 mW. XPS analysis was performed on a
PHI 5000 Versa Probe high performance electron spectrometer, using …
JH Ramirez-Leyva, G Vitale, A Hethnawi, A Hassan… – ACS Applied Nano …, 2018
… to a pseudo-Voigt profile function.27 X-ray Photoelectron Spectroscopy
(XPS) XPS was carried out with a PHI VersaProbe 5000 spectrometer.
The spectra were taken using monochromatic Al source (1486.6 eV) at …
Y Kwon, Y Lee, SO Kim, HS Kim, KJ Kim, D Byun… – ACS Applied Materials & …, 2018
… applying an AC voltage of 5 mV. For post-mortem X-ray photoelectron
spectroscopy (XPS, 5000 Versaprobe, Ulvac-PHI) analyses, the coin cells
after storage at high temperature and cycling were disassembled in an …
SK Singh, P Azad, MJ Akhtar, KK Kar – ACS Applied Nano Materials, 2018
… range 4000-500 cm−1 using transmission mode spectrum. The X-ray photoelectron
spectroscope (XPS; PHI 5000 Versa Probe II, FEI Inc.) was utilized to analyze the
presence of chemical bonding states on the surface of CNT coated CF …
X Wu, C Neil, D Kim, H Jung, YS Jun – Environmental Science: Nano, 2018
… S5†). 130 2.3 Oxidation state determination using X-ray photoelectron spectroscopy
(XPS) 131 X-ray photoelectron spectroscopy (XPS, PHI 5000 VersaProbe II, Ulvac-PHI
with 132 monochromatic Al Kα radiation (1486.6 eV)) was utili
Extrinsic p-type doping of few layered WS2 films with niobium by pulsed laser deposition
UP Rathod, J Egede, AA Voevodin, ND Shepherd – Applied Physics Letters, 2018
… treatment. Composition was analyzed by XPS with a PHI 5000 VersaProbe system
equipped with a monochromatic 1486.6 eV Al Ka source. The adventitious carbon
1s peak at 284.8eV was used as a refer- ence. Deconvolution …
A Facile Method to Prepare Mechanically Durable Super Slippery Polytetrafluoroethylene Coatings
Y Zhu, Y He, DQ Yang, E Sacher – Colloids and Surfaces A: Physicochemical and …, 2018
… 2.3. Characterization. Field emission scanning electron microscopy
(FE-SEM, Hitachi S4800) was employed to observe the surface morphology.
X-ray photoelectron spectroscopy (XPS, PHI 5000 Versaprobe-II) was used …
X Zhang, H Zhang, X Wang, X Zhou – RSC Advances, 2018
… The chemical states and bonding characteristics of the samples were determined
by Raman spectra (Renishaw inVia spectrometer, 514.5 nm laser) and X-ray
photoelectron spectroscopy (XPS) analysis (PHI 5000 VersaProbe) …
J Tong, W Li, B Wei, L Bo, Q Li, Y Li, T Li, Q Zhang – International Journal of Hydrogen …, 2018
… Catalysts characterizations. The XRD patterns were characterized by a
Shimadzu XD–3A (Japan) using filtered Cu-Kα radiation. X-ray photoelectron
spectrum (XPS) analysis was performed on a PHI 5000 Versaprobe system …
Fabrication of Ta3N5ZnO direct Z-scheme photocatalyst for hydrogen generation
YH Liang, MW Liao, M Mishra, TP Perng – International Journal of Hydrogen Energy, 2018
… The binding energies of oxygen O 1s in ZnO300/Ta 3 N 5 before and after sputtering for
600 s were determined by X-ray photoelectron spectroscopy (XPS, PHI 5000 Versaprobe
II, Ulvac PHI Inc.) with Al K α radiation. Photocatalytic hydrogen evolution …
D Semitekolos, P Kainourgios, C Jones, A Rana… – Composites Part B …, 2018
… Fourier-transform infrared spectroscopy (FT-IR) measurements were conducted using
a JASCO FT IR 6600 series equipped with an ATR germanium crystal, whereas XPS
analyses were performed with XPS versa Probe 5000 of PHI Electronics …
K Pal, K Ghorai, S Aggrawal, TK Mandal, P Mohanty… – Journal of Environmental …, 2018
… 2.2.3. XPS analysis. The XPS analysis was carried out by PHI-5000
VersaProbe III ULVAC-PHI Inc., XPS spectrophotometer. The analysis was
performed by mounting the specimens on the carbon tape and keeping it …
B Li, R Shi, C Han, H Li, L Xu, T Zhang, JQ Li, Z Lin… – Journal of Materials …, 2018
… were collected with 532 nm laser on HORIBA LabRAM HR800. X-ray
photoelectron spectroscopy (XPS, PHI 5000 VersaProbe II) with Al Kα
radiation was used to study the surface chemistry and elemental …
A novel ternary nanocomposite for improving the cycle life and capacitance of polypyrrole
CW Chu, FNI Sari, JCR Ke, JM Ting – Applied Surface Science, 2018
… X-ray photoelectron spectroscopy (XPS) analysis was performed using
VG Scientific ESCALAB 250 and ULVAC-PHI PHI 5000 Versaprobe II.
Raman spectra were recorded from 350 to 450 cm -1 using Renishaw …
JX Wei, N Cheng, Z Liang, Y Wu, Z Zou, Z Zhuang… – Journal of Materials …, 2018
… materials. The valence state of different elements in UiO-66 before and after the
incorporation of metal ions was determined by X-ray photoelectron spectroscopy (XPS,
PHI 5000 Versa Probe). The Fourier transform infrared (FTIR) spectra of all samples …
Carbon Dot Fluorescence Lifetime-Encoded Anti-Counterfeiting
S Kalytchuk, Y Wang, K Polakova, R Zbořil – ACS Applied Materials & Interfaces, 2018
… Orbit ZnSe ATR technique. The X-ray photoelectron spec- troscopy (XPS)
measurements were performed on a PHI VersaProbe II spectrometer (Physical
Electronics) using an Al Kα source (15 kV, 50 W). The obtained data were …
K Zhang, N Li, X Ma, Y Wang, J Zhao, L Qiang, X Li… – Journal of Electroanalytical …, 2018
… X-Ray photoelectron spectroscopic (XPS) analysis were recorded using a PHI-5000
VersaProbe (Kratos Axis Ultra Al at 14 kV). Thermogravimetric (TGA) curves were obtained
from a Perkin Elmer Pyris 6 between 25 and 750 °C in an air atmosphere. 2.3 …
Understanding oxygen activation on metal-and nitrogen-co-doped carbon catalysts
D Eisenberg, TK Slot, G Rothenberg – ACS Catalysis, 2018
… kV and 15 mA. X-Ray photoelectron spectroscopy measurements were carried
out using a PHI VersaProbe II scanning XPS microprobe (Physical Instruments
AG, Germany), using a monochromatic Al Kα X-ray source of 24.8 W power …
[PDF] Color Formation Mechanism of Ceramic Pigments Synthesized in the TiO2–SnO–ZnO Compounds
S Kim, U Kim, WS Cho – Journal of the Korean Ceramic Society, 2018
… 55, No. 4 ray diffraction (XRD, D/MAX2500VL/PC, Rigaku, Japan) was used
to analyze the crystalline phase of pigments. X- ray photoelectron
spectroscopy (XPS, PHI 5000 versaprobe, ULVAC-PHI Inc., Japan) was used …
Nitrogen-doped hierarchical porous carbons from used cigarette filters for supercapacitors
Q Xiong, Q Bai, C Li, D Li, X Miao, Y Shen, H Uyama – Journal of the Taiwan Institute …, 2018
… The pore size distribution (PSD) was determined according to the Barrett–Joyner–Halenda
(BJH) method. X-ray photoelectron spectroscopic (XPS) analysis was performed on a
PHI 5000 VersaProbe II spectrometer with a monochromatic Al Kα source (1486 eV) …
Perovskite oxide/carbon nanotube hybrid bifunctional electrocatalysts for overall water splitting
X Wu, J Yu, G Yang, H Liu, W Zhou, Z Shao – Electrochimica Acta, 2018
… X-ray photoelectron spectroscopy (XPS) measurement was used to analyse
the chemical compositions and surface element states on a PHI5000
VersaProbe spectrometer equipped with an Al-Kα X-ray source and the …
T Xu, JE Stubbs, PJ Eng, JG Catalano – Geochimica et Cosmochimica Acta, 2018
… The surface composition was measured after cleaning via X-ray
photoelectron spectroscopy (XPS) using a Physical Electronics 5000
VersaProbe II Scanning ESCA Microprobe with Al Kα X-ray …
RH Jhang, CY Yang, MC Shih, JQ Ho, YT Tsai… – Journal of Materials …, 2018
… obtained using a FEI Inspect F50 and Zeiss Supra 55 Gemini with acceleration voltages
of 10-20 kV. The X-ray photoelectron spectroscopy (XPS) measurements were done on
a PHI 5000 VersaProbe. The film composition profile was studied by Page 8 of 46 …
AKV Raj, PP Rao, TS Sreena, TRA Thara – Dyes and Pigments, 2018
… Data were collected from 10 to 90° 2θ range with a step size of 0.016°. XPS
of the samples were undertaken to establish the oxidation states and
variations of the binding energies of the constituent elements using PHI 5000 …
M Nath, S Song, AM Garbers-Craig, Y Li – Ceramics International, 2018
… Samples were finely ground using a mortar and pestle. XPS spectra was recorded
using an ESCA spectrometer (PHI 5000 VersaProbe, Ulvac-PHI, Physical Electronics),
equipped with a non-monochromatic Al-Kα X-ray source …
Semiconductor device and method for manufacturing the same
S Yamazaki – US Patent App. 15/921,730, 2018
… Note that the ionization potential of an oxide semiconductor can be measured by ultraviolet
photoelectron spectroscopy (UPS) or the like. Typically, VersaProbe (manufactured by
ULVAC-PHI Inc) is used as a measurement apparatus for UPS …
Nitrogen Doping in Ta2O5 and Its Implication for Photocatalytic H2 Production
WS Liu, SH Huang, CF Liu, CW Hu, TY Chen, TP Perng – Applied Surface Science, 2018
… The chemical states of all specimens on the surface were determined by
X-ray photoelectron spectroscopy (XPS, PHI 5000 Versaprobe II, Ulvac PHI
Inc.) with Al K α radiation, where the photoelectrons were collected into the …
D Han, K Park, JH Park, DJ Yun, YH Son – Journal of Industrial and Engineering …, 2018
… Shimadzu, ICPS-8100). Furthermore, X-ray photoelectron spectroscopy (XPS, Ulvac
PHI, VersaProbe) analyses were carried out to confirm the Ni 2p, Co 2p, Mn 2p, and
V 2p core binding energies in the samples. The thin specimens …
JI Bueno-López, JR Rangel-Mendez… – Chemosphere, 2018
… Sample preparation consisted of a GO dripping deposition on a silicon
wafer, dried at room temperature for 12 h and the resulting film was
analyzed using a PHI 5000 VersaProbe II equipment with a …
K Xiang, J Guo, J Xu, T Qu, Y Zhang, S Chen, P Hao… – ACS Applied Energy …, 2018
… instrument. An X-ray photoelectron spectroscopy (XPS) survey is conducted
using a PHI 5000 VersaProbe with an Al Kα excitation source. The atomic
ratios of different elements in the products are measured using inductively …
Ultrasensitive perovskite photodetectors by Co partially substituted hybrid perovskite
L Zheng, T Zhu, W Xu, J Zheng, L Liu, X Gong – ACS Sustainable Chemistry & …, 2018
… profilometer with a scan rate of 0.06 mm/s. X-ray photoelectron
spectroscopies (XPS) were conducted on a PHI 5000 Versa Probe II
scanning XPS microprobe to study the atomic components and real molar …
G Bendt, K Kaiser, A Heckel, F Rieger, D Oing, A Lorke… – Semiconductor Science and …, 2018
… X-ray photoelectron spectroscopy. XPS studies were performed using a Versaprobe
II™ (UlvacPhi) with monochromatic Al Kα light at 1486.6 eV photon energy. For
depth-profiling this machine is equipped with an Ar-sputter source …
All metal oxide-based transparent and flexible photodetector
S Abbas, M Kumar, J Kim – Materials Science in Semiconductor Processing, 2018
… 2.2. Characterization. The oxides of the silver and titanium were confirmed with X-ray
photoelectron spectroscopy (XPS-PHI 5000 Versa Probe II) and then scanning electron
microscopy (SEM-JSM7800F, Jeol) was used to analyze the surface morphology …
G Zhang, Y Sun, Y Xu, R Zhang – Journal of the Taiwan Institute of Chemical …, 2018
… The desorbed CO 2 was detected using a TCD detector. XPS analyses were performed
with a PHI 5000 Versaprobe II, using Al-Kα X-ray source. The C1s signal at 284.8 eV was
used as a standard for calibration of the obtained binding energies …
P Nath, M Chatterjee, N Chanda – ACS Applied Nano Materials, 2018
… an accelerating voltage of 200 kV. Detailed surface characterizations of the
nanocluster were performed using X-ray photoelectron spectroscopy (XPS, PHI
5000 Versa Probe II, FEI Inc.). The matrix assisted laser desorption …
J Kašlík, J Kolařík, J Filip, I Medřík, O Tomanec, M Petr… – Chemical Engineering …, 2018
… The X-ray photoelectron spectroscopy (XPS) measurements were carried out with
the PHI 5000 VersaProbe II XPS system (Physical Electronics) with monochromatic
AlK α source (15 kV, 50 W) and photon energy of 1486.7 eV …
T Dhawa, S Chattopadhyay, M Sreemany, G De… – Journal of Chemical …, 2018
… X-ray photoelectron spectroscopy (XPS) study of MWCNT/S composites
was carried out by a PHI 5000 VersaProbe II spectrophotometer (Physical
Electronics Inc.) using a monochromatized Al K\(_{\upalpha }\) (\sim \)1486.6 …
[PDF] Solution Processed CMOS compatible Carbon Nano-dots Based Heterojunction for Enhanced UV Detector
R Maiti, S Mukherjee, T Dey, SK Ray – arXiv preprint arXiv:1807.10825, 2018
… The average size of the CNDs is found to be ~2 nm from the HRTEM micrograph shown
in the inset of Fig. 1(a). X-ray photo electron spectra (XPS) (PHI 5000 Versa Probe II, INC,
Japan) showing the binding energy of C1s electrons of CNDs (Fig. 1(b)) which …
A Scheglov, A Helmke, L Loewenthal, G Ohms, W Vioel – Plasma Processes and …, 2018
… 2.3 | XPS measurements Within less than 5 min after the last plasma exposure, n = 3 pellets
per plasma processing time were transferred to the vacuum lock of the monochromatized
X-ray photoelectron spectrometer PHI VersaProbe II (Ulvac-phi, Inc., Osaka, Japan) …
Y Zhou, J Ren, L Xia, Q Zheng, J Liao, E Long, F Xie… – Electrochimica Acta, 2018
… Raman spectra were investigated on Raman spectrometer (Renishaw RM2000, UK).
The surface element analysis of NOPC-SD-x was tested by a PHI 5000 VersaProbe XPS
instrument (XPS, Thermo ESCALAB 250XI, USA). 2.3. Electrochemical measurement …
Ionic Liquid-Containing Pickering Emulsions Stabilized by Graphene Oxide-Based Surfactants
Q Luo, Y Wang, E Yoo, P Wei, EB Pentzer – Langmuir, 2018
… All reagents were used as received, without further purification. Centrifugation
was accomplished with an Eppendorf 5804 centrifuge. X-Ray Photoelectron
Spectroscopy (XPS) data was collected using a PHI Versaprobe 5000 …
L Chai, W Yuan, X Cui, H Jiang, J Tang, X Guo – RSC Advances, 2018
… F20). X-ray photoelectron spectroscopy (XPS, PHI 5000 VersaProbe II XPS) was
used to analyze the composition and valence states (a Monochromated Al Kα X-ray
source, 1486.6 eV). 2.6 Electrochemical measurements. The …
Kinetics of Uranyl Peroxide Nanocluster (U60) Sorption to Goethite
LR Sadergaski, AE Hixon – Environmental Science & Technology, 2018
… X-ray photoelectron spectroscopy (XPS) was used to 125 examine the valence states
of uranium and iron by measuring their respective photoelectron 126 spectra using a
PHI VersaProbe II X-ray photoelectron spectrometer. Spectra were collected at 127 …
Z Fei, Y Yang, M Wang, Z Tao, Q Liu, X Chen, M Cui… – Chemical Engineering …, 2018
… The H 2 consumption was monitored by TCD detector and was calibrated by the
quantitative reduction of Ag 2 O to Ag. The X-ray photoelectron spectroscopy (XPS) spectra
were recorded using a PHI 5000 Versa Probe high performance electron spectrometer …
C Wang, M Zhang, Y Fang, G Chen, Q Li, X Sheng… – ACS Sustainable Chemistry …, 2018
… (λ>420nm) and a portable UV lamp (ZF-7A, 365 nm 8 W and 254 nm 8 W)
were used as the light sources. The XPS spectrum was recorded by a PHI
Z Zhu, Y Zhou, S Wang, C Zhao, Z Li, G Chen, C Zhao – Electrochimica Acta, 2018
… The surface morphologies of samples were studied using Field Emission Scanning
Electron Microscopy (FESEM, Japan, Hitachi S-4800). The chemical state of the products
was analyzed by X-ray Photoelectron Spectroscopy (XPS, PHI 5000 Versa Probe) …
AKV Raj, PP Rao, TS Sreena, TRA Thara – Journal of Materials Science: Materials in …, 2018
… 90° in 0.016° steps. XPS of the Si4+ doped samples were undertaken to establish
the oxidation states and variations of the binding energies using PHI 5000 Versa
probe II having Al Kα monochro- matic source. The size and …
S Mondal, CR Raj – The Journal of Physical Chemistry C, 2018
… nanoparticles were acquired with JEOL JEM 2010 electron microscope
operating at 200 kV. X- ray photoelectron spectroscopic (XPS) analysis was
performed with PHI 5000 Versa Probe II scanning XPS microprobe …
RA Picca, K Manoli, A Luciano, MC Sportelli, G Palazzo… – Sensors and Actuators B …, 2018
… 2.4. XPS characterization of active layers. All the prepared layers were investigated
by X-ray Photoelectron Spectroscopy (XPS). A PHI Versaprobe II spectrometer equipped
with monochromatized Al Kα radiation (1486.6 eV) was used …
Method for forming perovskite layers using atmospheric pressure plasma
F Hilt, MQ Hovish, N Rolston, RH Dauskardt – US Patent App. 15/874,527, 2018
… X-ray photoelectron spectroscopy (XPS) measurements were carried out
on a PHI 5000 Versaprobe instrument (Physical Electronics Inc., US)
equipped with a hemispherical energy analyzer and a monochromatic …
J Morales, E Bolimowska, H Rouault, J Santos-Peña… – The Journal of Physical Chemistry …
… 59 60 Page 7. 7 X-ray photoelectron spectroscopy (XPS) analysis was performed
with Versaprobe II PHI 5000 (ULVAC-PHI) spectrometer using a 100 µm focused
monochromatic Al-Kα X-ray source (1486.6 eV) beam. Survey …
R Selvam, S Ramasamy, S Mohiyuddin, IVMV Enoch… – Materials Science and …, 2018
… Dynamic light scattering measurements were made using a Malvern Nano Zs90 Zetasizer.
The elemental composition of the PVA-CD-MNPs was found out employing a Phi 5000
versa probe ÌI base system X-ray photoelectron spectrometer …
H Guo, C Zhao, J Xu, Y Gong, M Velez, RC Buchanan – 2018
… Data was collected from 10° to 70° 2θ with a step size of 0.01°. Bulk compositions
as well as the chemical environments of the as-prepared glass foams were measured
using a PHI Versaprobe X-ray photoelectron spectrometer …
DS Bergsman, TL Liu, RG Closser, KL Nardi… – Chemistry of Materials, 2018
… NSC35 tip purchased from Nanoworld. X-ray photoelectron spectroscopy
(XPS) was performed on a PHI Versaprobe 3 with an Al Kα X-ray source.
Fine scans were collected in high resolution mode with pass energy of …
MEC Pascuzzi, E Selinger, A Sacco, M Castellino… – Electrochimica Acta, 2018
… containing samples. X-ray Photoelectron Spectroscopy (XPS). XP spectra were taken
on a PHI 5000 Versaprobe Scanning X-ray Photoelectron Spectrometer
(monochromatic Al Kα X-ray source with 1486.6 eV energy). Both high …
Egg-shell derived carbon dots for base pair selective DNA binding and recognition
S Pramanik, S Chatterjee, GS Kumar, PS Devi – Physical Chemistry Chemical Physics, 2018
… morphology. The X-ray photoemission spectroscopy measurements were executed
using a PHI 5000 Versa probe II scanning XPS microprobe (ULVAC-PHI, US) with
monochromatic Al Kα (hν = 1486.6 eV) radiation. Fourier …
A Pramanik, S Maiti, T Dhawa, M Sreemany, S Mahanty – Materials Today Energy, 2018
… A detailed X-ray photoelectron spectroscopic (XPS) study was made on
Zn-Co-S based materials supported on Ni-substrates in a PHI 5000
VersaProbe II spectrophotometer (Physical Electronics Inc., USA) using …
L Wen, F Gao, Y Yu, Z Xu, Z Liu, P Gao, S Zhang, G Li – Journal of Materials Chemistry …, 2018
… Scientific ESCALAB 250 Xi instrument, using a monochromatized Al Kα
(1486.6 eV) source. Ultraviolet photoelectron spectroscopy (UPS)
measurement was conducted on a Ulvac PHI 5000 Versaprobe instrument …
JS Li, TC Hsu, CC Hwang, KT Lu, TF Yeh – Materials Research Bulletin, 2018
… The experiment was carried out in an argon atmosphere at a heating rate
of 10 °C/min up to 800 °C. Electron spectroscopy for chemical analysis
(ESCA, ULVAC-PHI PHI 5000 Versa Probe/Scanning ESCA Microprobe) …
A Liu, M Ma, X Zhang, J Ming, L Jiang, Y Li, Y Zhang… – Journal of Electroanalytical …, 2018
… Transmission electron microscopy (TEM) was recorded on JEM-2100 transmission electron
microscopy (JEOL, Japan). X-ray photoelectron spectroscopy (XPS) were performed by
a PHI5000 VersaProbe (Ulvac-Phi, Japan) system with a monochromic Mg-Ka radiation …
D Benlin, X Tu, W Zhao, X Wang, DYC Leung, J Xu – Chemosphere, 2018
… 2.5. Material characterization. The phase structures of the samples were determined
by XRD (XRD-6000 X-ray diffractometer, SHIMADZU). XPS was performed using
a PHI5000 Versa Probe spectrometer (ULVAC-PHI, Japan) …
X Fan, Y Zhang, Y Zhu, X Guo, J Chen, L Li – Chemical Physics, 2018
… XPS (PHI 5000 VersaProbe) measurements were carried out in the present work to
investigate the valence states of titanium and carbon, and uncover the reaction
mechanisms. Each sample was evenly spread on the conductive tape in advance …
Partial oxidation of H2S to sulfur on V-Cu-O mixed oxides bronzes
L Ruiz-Rodríguez, T Blasco, E Rodríguez-Castellón… – Catalysis Today, 2018
… X-ray photoelectron spectra were collected using a Physical Electronics
spectrometer (PHI VersaProbe II Scanning XPS Microprobe) for the analysis
of core level signals of C 1s, O 1s, V 2p, Cu 3d and S 2p, with scanning …
Nitrogen-doped ZnO/Carbon hollow rhombic dodecahedral for photoelectrochemical sensing glutathione
C Wei, W Liu, Q Chen, H Hou, R Liu, C Cheng, C Hou… – Applied Surface Science, 2018
… X-ray photoelectron spectra (XPS) was carried out on Japan PHI 5000 Versa Probe with
Al K α radiation. The N 2 adsorption-desorption measurement was recorded on America
Micromeritics ASAP 2020 analyzer. 2.3. Photoelectrochemical measurements …
T Varga, TC Droubay, L Kovarik, D Hu, SA Chambers – Thin Solid Films, 2018
… High-resolution X-ray photoelectron spectroscopy (XPS) measurements
using a Phi 5000 VersaProbe fitted with a monochromatic focused Al-Kα
x-ray (1486.68 eV) source and a hemispherical analyzer were used to verify …
A Dasgupta, J Matos, H Muramatsu, Y Ono, V Gonzalez… – Carbon, 2018
… In order to characterize the chemical nature of the adsorbent surfaces,
X-ray photoelectron spectroscopy (XPS) experiments were conducted using
a Physical Electronics VersaProbe II instrument equipped with a …
X Ye, S Koppala, W Qu, S Xu, L Zhang, B Liu, S Guo… – Powder Technology, 2018
… The XPS spectra were recorded using an ULVAC PHI-5000 VersaProbe II spectrometer
with an Al K-alpha X-ray source (hm = 1486.6 eV) at a normal take-off angle and bandpass
energy of 50 eV, which corresponds to an energy resolution of 1.2 eV …
ML Yola, N Atar – Applied Surface Science, 2018
… A RikaguMiniflex X-ray diffractometer was performed for X-ray diffraction measurement.
PHI 5000 Versa Probe (Japan/USA) was utilized for XPS. ZEISS EVO 50 analytic
microscope (Germany) model was performed for SEM images. 2.3 …
Channelling and induced defects at ion-bombarded aligned multiwall carbon nanotubes
G D’Acunto, F Ripanti, P Postorino, MG Betti… – Carbon, 2018
… [[23], [24], [25]]. In Mons, XPS measurements were performed with a PHI VersaProbe 5000
from Physical Electronics with monochromatised Al K α radiation, 200 μm diameter
X-ray spot and 23.5 eV PE, accounting for an overall energy resolution of about 0.6 eV …
TT Nguyen, M Patel, DK Ban, J Kim – Journal of Alloys and Compounds, 2018
… Chemical analysis of the WS 2 film on the Si wafer was performed by X-ray photoemission
spectroscopy (XPS, PHI 5000 VersaProbe-II, ULVAC). The characteristic of WS 2 layer
was characterized by using a transmission electron microscope (TEM, TALOS F200X) …
R Ling, S Cai, D Xie, X Li, M Wang, Y Lin, S Jiang… – Chemical Engineering …, 2018
… Raman spectra for NVP/CP and NVP/CT were determined by using DXR Microscope
with a visible laser (λ = 532 nm) at ambient temperature. The X-ray photoelectron
spectroscopy (XPS) characterizations were implemented on a PHI5000 Versaprobe …
L Chen, GE Sterbinsky, SL Tait – Journal of Catalysis, 2018
… 2.2. Catalyst characterization. X-ray photoelectron spectroscopy (XPS)
measurements were recorded with a PHI Versaprobe II XP spectrometer
using a monochromated Al X-ray source. N 1s, C 1s, O 1s and Cl 2p regions …
Q Wang, W Hou, T Meng, Q Hou, Y Zhou, J Wang – Catalysis Today, 2018
… Transmission electron microscopy (TEM) analysis was carried out on a
JEM-2100 (JEOL) electron microscope (200 kV). X-ray photoelectron spectra
(XPS) was conducted on a PHI 5000 Versa Probe X-ray photoelectron …
H Gao, C Hao, Y Qi, J Li, X Wang, S Zhou, C Huang – Journal of Alloys and …, 2018
… nm). X-ray photoelectron spectroscopies (XPS) are performed on a Versa Probe
PHI 500 (monochromatic Al Kα excitation source). Raman spectroscopies are
measured by the Renishaw Raman microscope (Thermo Fisher) …
ZrO2 nanoparticles confined in metal organic frameworks for highly effective adsorption of phosphate
T Liu, J Feng, Y Wan, S Zheng, L Yang – Chemosphere, 2018
… diffraction-meter using a Cu Kα radiation. The X-ray photoelectron spectroscopy (XPS)
was conducted on a PHI5000 Versa Probe equipped with a monochromatized Al Kα
excitation source (hv = 1486.6 eV). The contents of ZrO 2 in …
X Yang, C Miao, Y Sun, T Lei, Q Xie, S Wang – Journal of the Taiwan Institute of …, 2018
… extraction, respectively. X-ray photoelectron spectroscopy (XPS) was performed
to analyze the IL-enriched upper phase using a PH1500 Versaprobe-II spectrometer
with monochromatic Al Kα radiation at hυ = 1486.6 eV. The …
A Holm, C Wrasman, KC Kao, AR Riscoe, M Cargnello… – Langmuir, 2018
… on an Agilent Cary300 Bio spectrophotometer. Far-UV cuvettes with
transmittance down to 170 nm were used. XPS spectra were collected using
a ULVAC-PHI PHI 5000 Versaprobe spectrometer with an Al Kα source with …
K Sakaushi, M Eckardt, A Lyalin, T Taketsugu… – ACS Catalysis, 2018
… Electronics PHI 5800 Multi ESCA System, applying monochromatized Al-Kα radiation
at an electron emission angle of 45° and pass energies of 29.35 eV or using a VersaProbe
II (ULVAC- PHI) instrument (electron emission angle 30°, pass energy 46.95 eV) …
Electrical Characteristics of Heterogeneous Polymer Layers in PEDOT: PSS Films
Y Kim, W Cho, Y Kim, H Cho, JH Kim – Journal of Materials Chemistry C, 2018
… DSA100). The work functions of the PEDOT:PSS films were directly measured by
ultraviolet photoelectron spectroscopy (Ulvac-PHI INC, PHI 5000 VersaProbe Ⅱ)
using He Ⅰ photons at 21.22 eV. Results and discussion Electric …
Improved performance of the functionalized nitinol as a prospective bone implant material
S Sinha, H Begam, V Kumar, SK Nandi, J Kubacki… – Journal of Materials …, 2018
… water to remove ethanol. The X-ray photoelectron spectroscopy (XPS) study (PHI5000
Versa Probe II, Ulvac-Phi Inc., Chigasaki, Japan) was done on silanized samples
so as to confirm the presence of Si. 2. Resorption study …
SH Chiu, YL Su, AVT Le, SH Cheng – Analytical and Bioanalytical Chemistry, 2018
… The surface film compositions were investigated using a PHI 5000 VersaProbe/
PHI Quantera SXM (XPS/ESCA) instrument with an AlKαX source. The water contact
angle was measured with a KRÜSS EasyDrop instrument …
Carbon Nanotubes Derived from Yeast-Fermented Wheat Flour and Their Energy Storage Application
Z Gao, N Song, Y Zhang, Y Schwab, J He, X Li – ACS Sustainable Chemistry & …, 2018
… spectroscopy (Renishaw InVia Raman microscope at 514 nm with 5%
laser power), X-ray photoelectron spectroscopy (XPS; PHI VersaProbe
III, Physical Electronics) and atomic force microscope (AFM; Dimension …
Coupled Chemical and Thermal Drivers in Microwave towards Ultrafast HMF Oxidation to FDCA
T Ji, C Liu, X Lu, J Zhu – ACS Sustainable Chemistry & Engineering, 2018
… analyzed with a sample size of 300 particles. X-ray photoelectron
spectroscopy (XPS) was carried out using a PHI VersaProbe II Scanning
XPS Microprobe with Al-K α line excitation source. RESULTS AND …
YF Cui, W Jiang, S Liang, LF Zhu, YW Yao – Journal of Materials Chemistry A, 2018
… X-ray photoelectron spectroscopy (XPS) measurements were carried out on an PHI 5000
Versa probe ll XPS system with a monochromatic X-ray source (Al Kα hν = 1486.6 eV).
Gas-sensing measurement. The structure of the sensor device is shown in Fig …
T Tsuruda, T Yoshida, K Shimata – US Patent App. 15/742,749, 2018
… XPS Measurement. An X-ray photoelectron spectrometer (manufactured by ULVAC-PHI,
Inc., product No.: VersaProbe II) was used for the surface of a passivation film 111 formed
on the surface of a stainless steel sheet to measure respective peaks of Fe2p and Cr2p …
[PDF] Water Research & Technology
J Myung, W Yang, PE Saikalyb, BE Logan
… This journal is © The Royal Society of Chemistry 2018 were performed
using a Physical Electronics VersaProbe II in- strument (Physical Electronics,
MN, USA) equipped with a monochromatic Al kα X-ray source (hν = 1486.7 …
SJ Park, YS Ko, SJ Lee, C Lee, K Woo, GP Ko – Environmental Science and Pollution …, 2018
… al. 2018). Moreover, an X-ray photoelectron spectroscopy (PHI 5000 VersaProbe;
ULVAC-PAI, Inc., Chigasaki, Japan) was used to identify the partially oxidized-naked
metallic AgNPs. Propagation and quantification of IFV-As …
Annealing effect of NiO/Co90Fe10 thin films: From bilayer to nanocomposite
X Li, YC Chang, JY Chen, KW Lin, RD Desautels… – Physics Letters A, 2018
… After annealing, the samples were cooled to room temperature at 0.25 K/s. The
depth-profile of X-ray photoelectron spectra (XPS) were measured with a ULVAC-PHI
PHI 5000 VersaProbe after Ar ion beam (2 × 2 mm 2 ) etching at 2 kV and 20 mA …
Y Yu, S Cheng, L Wang, W Zhu, L Luo, X Xu, F Song… – Sustainable Materials and …, 2018
… X-ray photoelectron spectroscopy (XPS) spectra were obtained on a XPS spectrometer
(PHI 5000 VersaProbe, Ulvac-Phi, Japan) using monochromated Al Kα radiation at a
pass energy of 50 eV. The 400 μm X-ray spot was used for XPS analysis …
X Yu, L Dong, L Li, P Lü, J Zhao – Journal of Nanoparticle Research, 2018
… transmission electron microscopy (HAADF-STEM) characterization. X-ray
photoelectron spectroscopy (XPS) was performed on PHI 5000 VersaProbe scanning
XPS microprobe with Al Kα radiation. The composition of Pd/Pt …
Surfactant-enriched ZnO Surface via Sol-gel Process for the Efficient Inverted Polymer Solar Cell
YC Chen, CH Lin, TF Guo, TC Wen – ACS Applied Materials & Interfaces, 2018
… S1. Depth profile and X-ray diffraction (XRD) experiments were analyzed by using PHI
5000 VersaProbe and the X-ray with a wavelength of 1.5406 Å from Rigaku 18 kW Rotating
Anode X-ray Generator, respectively. The morphology, surface properties …
D Mukherjee, D Das, A Dey, AK Mallik, J Ghosh… – Journal of Sol-Gel Science …, 2018
… The X-ray photoelectron spectroscopy (PHI 5000, Versaprobe II, USA) technique was
used with a Al Kα radiation source and the 284.5eV C1s signal as internal calibrator
to identify the chemical states in S1, H1, H2, H3, and H4 powders …
K Ma, M Zhang, S Miao, X Gu, N Li, S Cui, J Yang – Journal of Separation Science, 2018
… spectrometer (Bruker, Saarbrücken, Germany). The X-ray photoelectron
spectroscopy (XPS) analysis was performed on a PHI 5000 Versa Probe
system (UlVAC-PHI, Kana-gawa, Japan). Thermogravimetric analysis with …
L Li, Y Long, Y Chen, S Wang, LL Wang, S Zhang… – Solid State Sciences, 2018
… The elemental composition was analyzed using an energy-dispersive X-ray spectro-meter
(EDS) attached to the SEM. The surface composition was analyzed using a PHI5000
Versaprobe scanning XPS microprobe (XPS, ULVAC-PHI Inc., Japan) …
M Martins, J Milikić, B Šljukić, GSP Soylu, AB Yurtcan… – … and Mesoporous Materials, 2018
… 8100 microscope. X-ray photoelectron spectroscopy (XPS) analysis was carried
out using PHI 5000 VersaProbe spectrometer to get additional information on the
surface structure of the electrocatalysts. Electrical conductivity …
Structural and dynamic behavior of lithium iron polysulfide Li8FeS5 during charge–discharge cycling
K Shimoda, M Murakami, T Takeuchi, T Matsunaga… – Journal of Power Sources, 2018
… quadrupole splitting, QS) were extracted. XPS measurements were performed on
a PHI5000 VersaProbe II (ULVAC-PHI) photoelectron spectrometer with
monochromated Al K α radiation (1486.6 eV). The electrode sheet samples …
C Dietrich, R Koerver, M Gaultois, G Kieslich, G Cibin… – … Chemistry Chemical Physics, 2018
… consisted of periods of 5 min of milling alternating with 15 min of resting
(for cooling). 2.2 X-ray photoelectron spectroscopy (XPS) Measurements
were carried out using a PHI5000 Versa Probe II with an Al anode. The …
Facile Synthesis of Ligand-Free Iridium Nanoparticles and Their In Vitro Biocompatibility
AL Brown, H Winter, AM Goforth, G Sahay, C Sun – Nanoscale Research Letters, 2018
… Concentrations of iridium were adjusted to illustrate relative absorbance peaks.
XPS analysis was carried out on a PHI Versaprobe II fitted with a hemispherical
electron analyzer and aluminum Kɑ (1486.7 eV) X-ray source …
T Thurakitseree, C Kramberger, S Maruyama – Nanoscale, 2018
… The local chemical shifts of carbon and nitrogen were analyzed by photoelectron spec-
troscopy (XPS) measured with a PHI 5000 VersaProbe setup at AlKα = 1.486 keV (the
beam size of 100 µm in diame- ter) on the transferred samples …
YP Lyu, YS Wu, TP Wang, CL Lee, MY Chung, CT Lo – Microchimica Acta, 2018
… X-ray photoelectron spectroscopy (XPS, PHI 5000 VersaProbe) was carried out to
characterize the surface functionality of the carbon nanofibers after N-doping.
Electrocatalyzing and H 2 O 2 sensing properties of N-doped CNFs …
Carbon fibre functionalization by plasma treatment for adhesion enhancement on polymers
M Giorcelli, S Guastella, P Mandracci, Y Liang, X Li… – AIP Conference …, 2018
… Raman, Fesem and EDX analysis did not show particular differences in
carbon fibres before and after plasma treatments. XPS (PHI 5000 VersaProbe)
on the other hand, clearly evidenced the impact of functionalization …
M Sun, I Zucker, DM Davenport, X Zhou, J Qu… – Environmental Science & …, 2018
… surface. X-ray photoelectron spectroscopy (XPS) data were obtained with
a 150 scanning XPS microprobe (PHI, VersaProbe II, Japan) using
monochromatic Al Kα radiation 151 with a 0.47 eV system resolution. The …
P Wang, T Wu, Y Ao, C Wang – Renewable Energy, 2018
… electron microscope (JEOL JEM-200CX). The surface chemical binding energies
analysis of the samples was recorded by X-ray photoelectron spectroscopy (XPS,
PHI 5000 VersaProbe). The optical absorption measurements …
Y Wang, W Zhou, Q Kang, J Chen, Y Li, X Feng… – ACS applied materials & …, 2018
… spectrophotometer (PerkinElmer, Lambda 650). The composition of MnO2 was identified
by X- ray photoelectron spectroscopy (XPS, PHI 5000 VersaProbe) using MnO2/ITO films.
Electrochemical measurements Page 5 of 22 ACS Paragon Plus Environment …
CC Naik, SK Gaonkar, I Furtado, AV Salker – Journal of Materials Science: Materials …, 2018
… of the cubic spinel ferrite. X-ray photoelectron spectra (XPS) were obtained using
PHI versa probe II instrument, to determine the chemical composition and chemical
states of the species present. The surface morphology and …
S Anwer, G Bharath, S Iqbal, H Qian, T Masood, K Liao… – Electrochimica Acta, 2018
… UV–vis absorption spectra were taken on a SHIMADZU UV-3600
spectrophotometer. X-ray photoelectron spectroscopy (XPS) measurements
were performed on an XPS system (PHI, 5000 VersaProbe II) with Mg Kα …
YJ Yun, HJ Kim, DW Lee, S Um, HJ Chun – Journal of Industrial and Engineering …, 2018
… Atomic compositions of PLLA discs after the surface modifications were
analyzed by X-ray photoelectron spectroscopy (XPS) using PHI 5000
VersaProbe (ULVAC PHI Inc., Chigasaki, Japan) at source 15 kV with 24.5 …
W Zou, B Deng, X Hu, Y Zhou, Y Pu, S Yu, K Ma, J Sun… – Applied Catalysis B …, 2018
… X-ray photoelectron spectroscopy (XPS) analysis was determined by PHI 5000 VersaProbe
high performance electron spectrometer, on monochromatic Al Kα radiation (1486.6 eV),
the sample was outgassed at room temperature in a UHV chamber (< 5 × 10 –7 Pa) …
H Zhang, H Huang, J Xu, X Deng, G Li, X Liang… – Journal of Alloys and …, 2018
… 5°–80°. The X-ray photoelectron spectroscopy (XPS) was performedon a Phi 5000
Versa Probe Scanning ESCA Microprobe spectrometer (Ulvac-Phi, Inc. Japan). 2.3.
Electrochemical measurement. As supercapacitor electrode …
C Guhl, P Kehne, Q Ma, F Tietz, L Alff, P Komissinskiy… – Review of Scientific …, 2018
… holder. Within a Phys- ical Electronics VersaProbe XPS stage, a current was applied
between the metal springs touching the outer rim of the sam- ple holder and a copper
socket contacting the middle pin of the sample holder …
Y Gao, L Liang, S Zhao, Y Qi, W Zhang, X Sun, Z Wang… – RSC Advances, 2018
… Chemical compositions of SNP and SNP@PG nanocomposites were
characterized by Fourier transform infrared spectroscopy (FTIR, FTS-6000,
Bio-Rad Inc., USA), X-ray photoelectron spectroscopy (XPS, PHI5000 …
RK Mishra, JH Ryu, HI Kwon, SH Jin – Journal of Materials Chemistry A, 2018
… Raman spectroscopy was performed by using a WITEC/alpha 300 Raman
system (633 nm line of a He-Ne laser as an excitation source). The surface
chemical states of the materials were analyzed by X-ray photoelectron …
WC Huang, SY Wei, CH Cai, WH Ho, CH Lai – Journal of Materials Chemistry A, 2018
… J. Name., 2013, 00, 1-3 | 3 Please do not adjust margins Please do not adjust margins
with O2 + and Cs+ ion guns for etching and Ga+ and Bi+ cluster ion guns for analysis
and by X-ray photoelectron spectroscopy (XPS, ULVAC-PHI PHI 5000 VersaProbe II) …
S Baitalik, AR Molla, N Kayal – Journal of Alloys and Compounds, 2018
… X-ray photoelectron spectroscopy (XPS) analysis (PHI 5000 Versa Probe II (ULVAC-PHI,
Inc., Chigasaki, Japan) was done at room temperature under a high vacuum of 10 −8
mbar to study the surface energy of SiC ceramics prepared from coated SiC powders …
Y Zhou, S Maharubin, P Tran, TW Reid, GZ Tan – Environmental Science: Water …, 2018
… Silver oxidation analysis X-ray Photoelectron Spectroscopy (XPS) was performed on the
AgNP-PANI-PSF membrane samples by PHI 5000 Versaprobe-II Focus (ULVAC-PHI, Inc.
Japan) to study the effect of DC on the oxidation state of AgNPs …
Stabilizing Li10SnP2S12/Li interface via an in-situ formed solid electrolyte interphase layer
B Zheng, J Zhu, H Wang, M Feng, E Umeshbabu, Y Li… – ACS Applied Materials & …, 2018
… X-ray photoelectron spectroscopy (XPS) was carried out on a PHI 5000 Versa Probe III
spectrometer (ULVAC-PHI, Japan) and etching experiments were performed on the sample
surface using argon ion beam gun operation at 25.1 W. The binding energy scale was …
Electrically Conductive Copper Core–Shell Nanowires through Benzenethiol-Directed Assembly
Q Xiao, JA Burg, Y Zhou, H Yan, C Wang, Y Ding… – Nano Letters, 2018
… Postimaging analysis was performed using ImageJ. X-ray Photoelectron
Spectroscopy (XPS). Elemental compositions of core−shell nanowires were
analyzed using a PHI 5000 Versaprobe XPS (ULVAC-PHI Inc., MN) with …
G Mani, S Kim, K Kim – Biomacromolecules, 2018
… Page 6. 6 recorded on a ULVAC-PHI 5000 Versa Probe Phi X-Ray
photoelectron spectrometer (PHI 5000 Versa Probe-II. The transmission
electron microscopic (TEM) images and EDS spectra were recorded on an …
Insights into the static friction behavior of Ni-based superalloys
P Stoyanov, L Dawag, W Joost, DG Goberman, S Ivory – Surface and Coatings …, 2018
… at 665 °C. X-ray Photoelectron Spectroscopy (XPS) (PHI 5000 VersaProbe, Physical
Electronics Inc.) analysis was performed on unworn surfaces in order to provide
a better understanding of the chemical changes. Prior to the …
C Shan, H Dong, P Huang, M Hua, Y Liu, G Gao… – Chemical Engineering …, 2018
… mA). X-ray photoelectron spectroscopy (XPS, PHI 5000 VersaProbe, UlVAC-PHI,
Japan) was employed to determine the valence state of Ce in Ce-201. All binding
energies were referenced to the C 1s peak at 284.8 eV. XPS …
Aİ Vaizoğullar – Photochemistry and Photobiology, 2018
… Optical properties were measured using UV-vis DRS spectrophotometer at room
temperature. X-Ray photoelectron spectroscopic (XPS) measurements were performed
using PHI 5000 Versa Probe. RESULTS and DISCUSSION SEM Results …
H Kim, J Hong, C Kim, EY Shin, MJ Lee, YY Noh… – The Journal of Physical …, 2018
… of perovskite layers. X-ray photoemission spectroscopy (XPS) and ultraviolet
photoemission spectroscopy (UPS) using a PHI 5000 VersaProbe II from
ULVAC-PHI were performed in the analysis ultra-high vacuum chamber …
M Boffito, F Di Meglio, P Mozetic, SM Giannitelli… – PloS one, 2018
… To assess the successful surface functionalization, XPS was performed on
pristine PU, PU after plasma-polymerized acrylic acid coating (plasma-treated
PU), PU-G and PU-LN1 scaffolds using a PHI 5000 Versaprobe instrument …
H Bai, W Xu, J Guo, C Su, M Xiang, X Liu, R Wang – Journal of Materials Science: Materials …
… X-ray photoelectron Page 3. Journal of Materials Science: Materials in Electronics
1 3 spectroscopy (XPS, PHI5000 Versaprobe-II) was performed to determine the
elemental composition. 2.3 Electrochemical measurements …
A Jilani, SZ Hussain, MHD Othman, U Zulfiqar… – Journal of Atmospheric …, 2018
… The survey scan and the chemical state of collected PM was analyzed by
PHI 5000 Versa Probe II X-rays Photoelectron Spectroscopy under
ultra-high vacuum ~10 … The XPS versa probe II generated data was interpreted …
L Wu, L Shen, T Wang, X Xu, Y Sun, Y Wang, Y Zhao… – Journal of Alloys and …, 2018
… MAX 20, UK). X-ray photoelectron spectrum (XPS) was carried out using a PHI 5000
VersaProbe (UIVAC-PHi, Japan) with Al Kα radiation (1486.6 eV). 2.4.
Electrochemical measurements. The electrochemical performances …
R Karthik, JV Kumar, SM Chen, P Sundaresan… – Ultrasonics Sonochemistry, 2018
… The X-ray photoelectron spectroscopy (XPS) was investigated by ULVAC-PHI 5000
VersaProbe III equipment. All the electrochemical measurements were performed using
CHI 405a electrochemical workstation (CH Instruments, USA) …
DC Tsai, ZC Chang, BH Kuo, CM Chen, EC Chen… – Journal of Materials …, 2018
… same rate of 5 °C/min. The chemical compositions of the coatings were determined
by electron spectroscopy for chemical analysis (ESCA, PHI 500 VersaProbe) with
monochromatic Al Kα radiation. X-ray diffraction (XRD, MAC …
Stabilisation of small mono-and bimetallic gold-silver nanoparticles by calix [8] arene derivatives
P Ray, M Clément, C Martini, I Abdellah, P Beaunier… – New Journal of Chemistry, 2018
… X-ray photoelectron spectroscopy (XPS) was performed on a PHI 5000
VersaProbe II (Physical Electronics) equipped with a monochromatic
Aluminum source (Al, Kα = 1486.6 eV, beam size: 100 µm; X-ray voltage …
YF Shih, MY Chou, HY Lian, LR Hsu, SM Chen-Wei – Express Polymer Letters, 2018
… taken using the KBr disk method. Electron spectroscopy for chemical analysis (ESCA)
was carried out using the ULVAC- PHI PHI5000 Versaprobe(ULVAC-PHI Inc., Kana-
gawa, Japan). The morphology of PLF was observed …
A Ansari, S Sachar, SS Garje – New Journal of Chemistry, 2018
… (DLS) using Malvern Nano-ZS 90. The surface composition measurements were carried
out on an X-ray photoelectron spectroscopy (XPS) (PHI 5000 versa probe II) using
Al Kα (hυ = 1486.6 eV) X-rays as an excitation source. 2.4 …
F Cheng, M Li, W He, B Sun, J Qin, J Qu – Journal of Chromatography A, 2018
… 2.4. X-ray photoelectron spectroscopy (XPS). A PHI 5000 Versaprobe Ⅲ X-ray
photoelectron spectrometer equipped with a monochromatic A1 Kα radiation was utilized
to characterize the resin surface at a takeoff angle of 45° from the sample surface …
Magnetic properties of Cr2AlB2, Cr3AlB4, and CrB powders
S Kota, W Wang, J Lu, V Natu, C Opagiste, G Ying… – Journal of Alloys and …, 2018
… A Physical Electronics VersaProbe 5000 instrument was used to conduct X-ray
Photoelectron Spectroscopy (XPS). Cold pressed disks of NaOH-treated Cr 2 AlB 2 were
analyzed after sputtering with Ar beam for 2 min before recording the data …
Preparation and properties of Ag modified Tb-doped ZrO2 nanotube arrays
L Gong, X Wang, X Xu, H Hu, J Zhao – Ceramics International, 2018
… A scanning electron microscope (SEM, Nova Nano SEM450 FEI), a
transmission electron microscope (TEM, Tecnai Spirit FEI), an X-ray
diffractometer (XRD, D/maxRB Rigaku) and an X-ray photoelectron …
MM Sajid, SB Khan, NA Shad, N Amin, Z Zhang – RSC Advances, 2018
… of 20 kV. The elemental analysis of the nanoparticles was examined using
energy-dispersive X-ray spectroscopy (EDX), with an FESEM microscope attached
to an XPS spectrometer (PHI 5000 Versa Probe). The absorbance …
C An, W Li, M Wang, Q Deng, Y Wang – Electrochimica Acta, 2018
… TEM) on a JEOL JEM-2100. The X-ray photoelectron spectrometer (XPS, PHI 5000
Versaprobe, ULVAC PHI) was carried out to analyze the valence state of the MnO
2 @C-BD materials. The porous properties and specific surface …
Are the organic templates responsible for magnetic and optical response of MgO nanoparticle?
JP Singh, SH Kim, HK Kang, SO Won, IJ Lee, KH Chae – Materials Chemistry …, 2018
… The obtained spectra were normalized with respect to incident photon flux24,39.
XPS measurements were carried out using PHI500 VersaProbe (Ulvac-PHI) X-ray
photoelectron spectrometer in high vacuum of 2.0×10-7 Torr …
Y Zhang, Z Bakenov, T Tan, J Huang – Metals, 2018
… Brunauer Emmett Teller (BET) (V-Sorb 2800P) tests were conducted to investigate the
specific surface area of the composites. X-ray photoelectron spectroscopy (XPS) data
was obtained with a PHI 5000 Versa Probe system (Ulvac-Phi, Kanagawa, Japan) …
Y Miao, Z Lian, Y Huo, H Li – 2018
… EDX). The thermal sta‐ bility was investigated by a thermogravimetric analysis
(TGA, DTG‐60H). X‐ray photoelectron spectroscopy (XPS, Versa Probe PHI 5000)
was employed to determine the surface electronic states. All …
ATE Vilian, B Dinesh, M Rethinasabapathy, SK Hwang… – Journal of Materials …, 2018
… Page 8. 7 used to study the oxidation state and the presence of various elements with
XPS ULVAC-PHI PHI 5000 VersaProbe. Fig. 1. Schematic diagram of the synthesis of
RGO‒Co3O4 for high-performance supercapacitor and nonenzymatic glucose sensing …
C Huang, SX Zhao, H Peng, Y Lin, C Nan, GZ Cao – Journal of Materials Chemistry A, 2018
… desorption isotherms with a Micromeritics-ASAP 2020 adsorption analyzer. The
XPS analyses were carried out on a PHI 5000 VersaProbe II spectrometer using
monochromatic Al K(alpha) X-ray source. Inductively coupled …
Y Chen, W Lu, Y Guo, Y Zhu, H Lu, Y Wu – RSC Advances, 2018
… 2.8.6 X-ray photoelectron spectroscopy. The compositions of film surface
were detected by a PHI VersaProbe X-ray photoelectron spectroscopy
(XPS) in an ultrahigh vacuum chamber (1 × 10 6 mmHg). The energy pass …
S Viehbeck, C Iffelsberger, FM Matysik – Composites Part A: Applied Science and …, 2018
… calculated as mean value. 2.4. XPS experiments: X-ray photoelectron spectroscopy
(XPS) was performed with a commercial system Phi 5000 VersaProbe III (Ulvac PHI,
Hagisono, Chigasaki, Kanagawa, Japan). The same samples …
Thermal annealing of black phosphorus for etching and protection
S Yang, A Kim, J Park, H Kwon, PT Lanh, S Hong… – Applied Surface Science, 2018
… During the SKPM measurement, an AC voltage is applied to the tip with
2-3 V amplitude and 17-18 kHz frequency using an external lock-in amplifier.
X-ray photoelectron spectroscopy (XPS) measurements on the BP were …
J Liu, P Winwarid, TCK Yang, SSC Chuang – Physical Chemistry Chemical Physics, 2018
… S1). 17 Surface states of the TiO2 and N-TiO2 working electrodes was determined by
X-ray photoelectron spectroscopy (XPS) with monochromatic Al-Kα source (XPS, PHI
5000 VersaProbe II, ULVAC-PHI Inc, Fig. S2). 2.3 DSSC Assembly …
K Xu, F Song, J Gu, X Xu, Z Liu, X Hu – Journal of Materials Chemistry A, 2018
… The elemental ratio was calculated from the Kα peak area of each element,
using the software of ESPRIT 2 (Bruker). XPS measurements were
performed on a PHI5000 Versa Probe II XPS system by Physical Electronics …
J Wang, Y Zheng, W Chen, Z Wang – Colloid and Polymer Science, 2018
… UV-visible absorption spectra were measured at room temperature on a
UV-3600 SHIMAZDU UV-visible spectrometer, and X-ray photoelec- tron
spectroscopy (XPS) analysis was carried out on a PHI5000 VersaProbe …
K Lee, TH Kim – Electrochimica Acta, 2018
… Electrical conductivity was measured by Powder Resistivity Measurement System
(Loresta) using 4-probe method. XPS was measured by PHI 5000 Versaprobe-II
(ULVAC-PHI). SEM image was taken by FE-SEM-7800F (JEOL) …
Multi-doped Brookite-Prevalent TiO 2 Photocatalyst with Enhanced Activity in the Visible Light
S Cataldo, BM Weckhuysen, A Pettignano, B Pignataro – Catalysis Letters, 2018
… 2.6 XPS Measurements X-ray Photoelectron Spectroscopy (XPS) spectra were acquired
using a PHI 5000 VersaProbe II spectroscope (Physical Electronics, ULVAC-PHI Inc.;
USA) using a mon- ochromatic Al-Kα X-ray source with a 200 µm spot size at 50 W power …
Reduction of sulphur dioxide using carbon monoxide over gold supported catalysts
T Ngwenya, I Nongwe, LL Jewell – Gold Bulletin, 2018
… catalyst surface with a PHI 500 Versaprobe-scanning ESCA microprobe system.
The XPS surveys and high-resolution spectra were done with 100 μm 25 W 15 kV
Al monochromatic x-ray beam. The sputtering was done with …
J Li, C Hao, S Zhou, C Huang, X Wang – Electrochimica Acta, 2018
… respectively. X-ray photoelectron spectroscopies (XPS) is finished on a PHI500
Versa Probe with monochromatic Al Kα radiation sourse. Raman spectra are
measured by the Thermo Scientific DXR Raman microscope. The …
K Shalini, G NambiVenkatesan – Materials Research Express, 2018
… electron microscope (HR-TEM). X-ray Photoelectron spectroscopy (XPS)
measurements were carried out by using Versa Probe II (Model PHI) with
AES to reveal the ionic/chemical states of species. UV-visible studies were …
Effect of growth temperature on AlN thin films fabricated by atomic layer deposition
Y Kim, MS Kim, HJ Yun, SY Ryu, BJ Choi – Ceramics International, 2018
… The chemical composition and bonding state in AlN film were characterized by x-ray
photoelectron spectroscopy (XPS). XPS analysis was performed using a PHI 5000
Versaprobe (Ulvac-PHI) equipped with a monochrome Al Kα (1488.6 keV) source …
CT Tsai, YH Liu, JF Tang, PC Kao, CH Chiang, SY Chu – Synthetic Metals, 2018
… The UV–vis absorption spectrum was procured by a spectrophotometer
(HITACHI U-3310) with scan rate of 600 nm/s. UPS analysis was measured
using an electron spectroscopy analysis system (ULVAC-PHI 5000 Versaprobe …
Growth and characterization of co-sputtered aluminum-gallium oxide thin films on sapphire substrate
CC Wang, SH Yuan, SL Ou, SY Huang, KY Lin… – Journal of Alloys and …, 2018
… the Tauc plot. The composition of the film was characterized by X-ray photoelectron
spectroscopy (XPS, ULVAC-PHI, PHI 5000 VersaProbe) and secondary-ion-mass
spectrometry (SIMS, ION-TOF, TOF-SIMS IV). For the fabrication …
D Nayak, S Ghosh, A Venimadhav – Materials Chemistry and Physics, 2018
… X-ray photoelectron spectroscopy (XPS) data were collected by using PHI 5000 Versa
Probe II spectrometer with Phobios 100MCD Energy Analyzer. 2.3. Electrochemical tests.
All electrochemical experiments were carried out using lab scale Swagelok-type cells …
S Thampya, V Ibarraa, YJ Leea, G McCoolb, K Choa… – … , STRUCTURE, AND GAS …, 2018
… SEM). The particles size analysis was carried out using Image J software. X-ray
photoelectron spectroscopy (XPS) measurements were performed in a PHI5000
Versa Probe II (Physical Electronics Inc.). Photoelectrons were …
Y Sun, Y Wang, Y Wu, X Wang, X Li, S Wang, Y Xiao – Analytical Chemistry, 2018
… Acetone, anhydrous ethanol, isopropanol was obtained from Rianlon corporation
(Tianjin, China). The elemental composition of the film surface was detected by the
PHI 5000 Versa Probe X-ray photoelectron spectroscopy (Japan) …
P Khandekar, K Biswas, D Kothari, H Muthurajan – Advanced Science Letters, 2018
… Figure 4 represents the closer image of 300 m nozzle micro thrusters. 2.2.
X-ray Photoelectron Spectroscopy (XPS) Elemental composition of micro
thrusters was determined by using X-ray photoelectron spectroscopy. The …
D Paul, S Rudra, P Rahman, S Khatua, M Pradhan… – Journal of Organometallic …, 2018
… Transmission electron microscopy (TEM) analysis was performed in a JEOL 2100,
operating at an acceleration voltage of 300 kV. X-ray photoelectron spectroscopy (XPS)
analysis was performed with PHI 5000 Versa Probe II, FEI Inc. scanning XPS microprobe …
Enhanced Photocatalytic Degradation Performance by Fluid-induced Piezoelectric Field
L Ling, Y Feng, S Yan, D Pan, H Ge, H Li, H Li, Z Bian – Environmental Science & …, 2018
… 94 Surface electronic states was determined by X-ray photoelectron spectroscopy (XPS,
PHI 5000 95 Versaprobe II). The shift of the binding energy due to relative surface charging
was corrected 96 using the C1S level at 284.8 eV as an internal standard …
N Zhang, X Zhang, E Shi, S Zhao, K Jiang, D Wang… – Journal of Energy Chemistry, 2018
… 2.2. Characterization of materials. The actual ratios of Li : Ni : Co : Al were verified by
inductively coupled plasma test (ICP, Optima5300DV). The X-ray photoelectron
spectroscopy (XPS) results were obtained on a PHI 5000 VersaProbe …
MCF Karlsson, Z Abbas, R Bordes, Y Cao, A Larsson… – Dyes and Pigments, 2018
… Standards [9]. The surface coatings of the pigments were analysed prior to and after
the recycling process using XPS using a Versaprobe III from Physical Electronics
equipped with monochromatic Al Kα X-ray source (1486.6 eV). An …
Electronic Band Structure and Electrocatalytic Performance of Cu3N Nanocrystals
LC Wang, BH Liu, CY Su, W Liu, CC Kei, KW Wang… – ACS Applied Nano …, 2018
… 0.3 o for maximum intensity. The composition of Cu3N was analyzed
by X-ray photoelectron spectroscopy (XPS, ULVAC-PHI PHI5000
Versaprobe II). The Φ and band edges of Cu3N were determined by …
Y Wang, J Zhou, X Hao, Y Wang, Z Zou – Applied Surface Science, 2018
… Transmission electron microscope (TEM) images were taken using a JSM-3100F electron
microscope. The valence band and binding energy of samples were characterized by the
PHI 5000 VersaProbe X-ray photoelectron spectrometer (XPS) …
Solvent-dependent carbon dots and their applications in detection of water in organic solvents
D Chao, W Lyu, Y Liu, L Zhou, Q Zhang, R Deng… – Journal of Materials …, 2018
… microscope. Fourier transform infrared (FT-IR) spectrum was obtained on a
Nicolet-6700 spectrometer. The X-ray photoelectron spectroscopy (XPS) was
conducted on with PHI 5000 Versa Probe (ULVAC-PHI, Japan). Synthesis …
Deposition of nanocrystal thin films of Cu 2 Se and their optical and electrical characterization
NS Babu, MA Khadar – Applied Surface Science, 2018
… voltage of 200 kV. X-ray photoelectron spectra of the Cu 2 Se NC films were recorded
by using a PHI Versa Probe II, FEI Inc. scanning X- ray photoelectron spectroscopy
(XPS) microprobe instrument. AFM measurements were …
M Koklioti, C Bittencourt, X Noirfalise, I Saucedo… – ACS Applied Nano …, 2018
… and 633 nm. The evaluation of sample composition was conducted by
X-ray photoelectron spectroscopy using a VERSAPROBE PHI 5000 from
Physical Electronics, equipped with a monochromatic Al Kα X-ray source …
K Abinaya, S Karthikaikumar, K Sudha… – Solar Energy Materials and …, 2018
… crystalline phases of the materials. The elemental composition of AG-PYPMI was
investigated by X-ray Photoelectron Spectroscopy (XPS) using PHI 5000 Versa Probe
II, FEI Inc. Inductively coupled plasma mass spectrometry …
A Basak, L Ramrakhiani, S Ghosh, R Sen, AK Mandal – Journal of Non-Crystalline …, 2018
… 2.4.9. XPS spectroscopy. X-ray photoelectron spectroscopy (XPS) measurements
were carried out for the glass samples formulated via conventional as well as MW
heating using PHI 5000 XPS-analyzer, Versaprobe-II, USA …
G Chen, Y Guo, S Miao, H Sun, B Gu, W Li, Y Zhong… – Journal of Power Sources, 2018
… X-ray diffraction patterns were obtained on a Rigaku Smartlab by continuous scanning
in the 2θ range of 10–60° with an interval of 0.02°. The transition metal oxidation states
were detected by X-ray photoelectron spectroscopy (PHI5000 Versaprobe spectrometer) …
I Som, VK Balla, M Das, D Sukul – Journal of Materials Research, 2018
… reported. The composition of the oxidized surface layers was analyzed using X-ray
photoelectron spectroscopy (XPS; PHI 5000 VersaProbe II, Physical Electronics
Inc., Chanhassen, Minnesota) with the Al-Ka source. Narrow …
X Pan, J Chen, N Wu, Y Qi, X Xu, J Ge, X Wang, C Li… – Water Research, 2018
… X-ray powder diffraction (XRD) spectrum was analyzed by an X’TRA X-ray diffractometer
(ARL, Switzerland). The nitrogen contents of different catalysts were measured by a PHI
5000 VersaProbe X-ray photoelectron spectroscopy (XPS, UIVAC-PHI, Japan) …
PY Chang, IH Tseng – Journal of CO2 Utilization, 2018
… acceleration voltage of 120 kV. The chemical composition of each sample was
investigated by an X-ray photoelectron spectroscope (XPS, Ulvac-Phi 5000
VersaProbe) using Al Kα radiation. XPS valence band spectra obtained …
C Chen, YC Chen, YT Hong, TW Lee, JF Huang – Chemical Engineering Journal, 2018
… spectroscopy (Tokyo Instrument, Nanofinder 30). The surface electronic states were
then analyzed by X-ray photoelectron spectroscopy (XPS) (ULVAC-PHI, PHI 5000
VersaProbe/Scanning ESCA Microprobe). The XPS spectra were …
Microwave-assisted synthesis of TiO 2/WS 2 heterojunctions with enhanced photocatalytic activity
EC Cho, CW Chang-Jian, JH Zheng, JH Huang… – Journal of the Taiwan …, 2018
… spectrophotometer (GBC Cintra 2020). X-ray photoelectron spectroscopy/ultraviolet
photoelectron spectroscopy (XPS/UPS) was performed using a PHI 5000 VersaProbe
system (ULVAC-PHI, Chigasaki, Japan). The photocatalytic activity …
P Li, Y Li, Z Zhang, J Chen, Y Li, Y Ma – Materials Science for Energy Technologies, 2018
… characterization. The X-ray photoelectron spectroscopy (XPS) measurements were
carried out on PHI 5000 Versa Probe using 200 W monochromated Al Kα radiation.
The 500 μm X-ray spot was used for XPS analysis. Typically …
Polyacrylic-Polyethersulfone Membrane Modified via UV Photografting for Forward Osmosis Application
AFHBA Rahman, MNBA Seman – Journal of Environmental Chemical Engineering, 2018
… The x-ray photoelectron spectroscopy (XPS) measurements were conducted using
a PHI-5000 VersaProbe II spectrometer. It is equipped with a monochromated AI
Kα as the radiation source to determine the binding energy …
C Li, Q Fu, K Zhao, Y Wang, H Tang, H Li, H Jiang… – Carbon, 2018
… FTIR spectrums were measured by a Thermo Scientific Nicolet iS50. XPS was
performed on a PHI 5000 VersaProbe. 2.3. Electrochemical tests. The electrochemical
properties were evaluated by using coin-type cells (CR2032) …
BT Liu, CC Hsieh – Journal of the Taiwan Institute of Chemical Engineers, 2018
… The elemental analysis and binding energy of the surface of catalysts were
determined by X-ray photoelectron spectroscopy (XPS) (PHI 5000 VersaProbe,
ULVAC-PHI) at a take-off angle of 90°. All XPS spectra were calibrated using …
X Sun, K Ma, C Li, W Li – Journal of Alloys and Compounds, 2018
… The composition of Fe-doped In 2 O 3 NWs was investigated by X-ray photoelectron
spectroscopy (XPS) on a PHI5000 VersaProbe. The optical properties of samples were
performed and recorded with a He-Cd laser (325 nm) at room temperature. 2.4 …
H Wang, Y Zheng, W Cui, Y Sun, D Zhang – Applied Surface Science, 2018
… The X-ray photoelectron energy spectrum were measured on the PHI 5000
VersaProbe systems in which an Al Ka X-ray source was operated at 150
W. Raman spectrum (Jobin Yvon HR 800 confocal Raman system) were …
In vitro interaction and biocompatibility of titanate nanotubes with microglial cells
S Sruthi, A Loiseau, J Boudon, F Sallem, L Maurizi… – Toxicology and Applied …, 2018
… X-ray Photoelectron Spectroscopy (XPS) analyses were recorded by a PHI
5000 Versaprobe apparatus with a monochromatic Al K α1 X-ray source
(energy of 1486.7 eV with a 200 μm spot size, accelerating voltage of 12 …
[PDF] STRUCTURAL AND OPTICAL CHARACTERIZATION OF (FEXMN1-X) 2O3 PIGMENTS FOR SOLAR ABSORPTION APPLICATIONS
E Sánchez, E Barrera-Calva, L Huerta-Arcos, E Ríos… – Revista Mexicana de …, 2018
… among others. X-ray photoelectron spectroscopy (XPS) analysis was performed in
several selected samples using ultra-high vacuum (UHV) system Scanning XPS
microprobe PHI 5000 VersaProbe II, with a Al Kα X- ray source …
C Takai, M Senna, S Hoshino, H Razavi-Khosroshahi… – RSC Advances, 2018
… 1 under pure air flow. The results were adopted from the third cycle, unless otherwise
stated. Oxidation states of vanadium were examined by XPS (PHI 5000, Versa Probe
II, Ulvac-Phi, Inc). Ar ion etching was also performed …
G Lin, S Wang, L Zhang, T Hu, J Peng, S Cheng, L Fu… – Journal of Cleaner …, 2018
… FT-IR spectroscopy was conducted using Nicolet iS10 (ThermoFisher, USA)
with a resolution of 4 cm -1 to detect the function groups of the sample. XPS
was performed by PHI-5000 Versaprobe II (Inc., Chanhassen, MN, USA) …
Mo doping of layered Li (NixMnyCo1‐x‐y‐zMz) O2 cathode materials for lithium‐ion batteries
B Pişkin, C Savaş Uygur, MK Aydınol – International Journal of Energy Research, 2018
… Selected area electron diffraction (SAED) patterns of cathodes were also collected
with the same conditions. Oxidation states of the cathodes were analyzed by X‐
ray photoelectron spectroscopy (XPS, PHI 5000 VersaProbe) …
Z Xu, W Li, Y Yan, H Wang, H Zhu, M Zhao, S Yan… – ACS applied materials & …, 2018
… X-ray photoelectron spectroscopy (XPS) was performed on a PHI5000
Versa Probe (ULVAC-PHI, Japan) with monochromatized Al Kα X-ray
radiation (1486.6 eV). The energy resolution of the electrons analyzed …
High specific surface area porous graphene grids carbon as anode materials for sodium ion batteries
H Zhang, H Guo, A Li, X Chang, S Liu, D Liu, Y Wang… – Journal of Energy Chemistry, 2018
… ray spectrometer (EDX) for elemental analysis. X-ray photoelectron spectroscopy
(XPS, PHI 5000 Versaprobe, ULVAC PHI) was employed to investigate the valence
of elements. The Fourier transform infrared (FTIR) spectrum …
Bright, Stable, and Tunable Solid-State Luminescence of Carbon Nanodot Organogels
Z Gan, L Liu, L Wang, GS Luo, CL Mo, CL Chang – Physical Chemistry Chemical …, 2018
… on JEOL-2100F. Fourier transform infrared (FTIR) spectra were recorded on a
NEXUS670 FTIR spectrometer. X-ray photoelectron spectroscopy (XPS) measurement
was carried out on a PHI 5000 VersaProbe. 2.3 PL and PLQY …
Aİ Vaizoğullar – Journal of Materials Science: Materials in Electronics, 2018
… Optical properties were performed using UV–Vis 1601 spectrophotometer
(Dr. Lange 1601 UV–Vis spectrophotometer) at room temperature. X-Ray
photoelectron spectroscopies (XPS) measurement was per- formed using …
Evidence of random distribution of carbon impurities in oxygen sites of zinc oxide
MA Korotin, DA Zatsepin, AV Efremov, L Cui… – Physica B: Condensed …, 2018
… X-ray photoelectron spectroscopy (XPS) measurements were performed
using a PHI XPS Versaprobe 500 spectrometer (ULVAC-Physical Electronics,
USA) with a quartz monochromator and analyzer guaranteed working in …
MW Chung, IY Cha, MG Ha, Y Na, J Hwang, HC Ham… – Applied Catalysis B …, 2018
… X-ray photoelectron spectroscopy (PHI 5000 VersaProbe, Ulvac-PHI) and X-ray absorption
near edge structure (XANES, RIGAKU) were conducted to identify the electronic structure
of the prepared catalysts. 2.3. Electrochemical Characterization …
A Öztürk, AB Yurtcan – International Journal of Hydrogen Energy, 2018
… Surface areas of the synthesized N-CNTs were determined according to
the Brunauer-Emmett-Teller (BET) method. X-ray photoelectron spectroscopy
(XPS) analysis was conducted with PHI 5000 VersaProbe device using …
[HTML] Cryochemical synthesis of ultrasmall, highly crystalline, nanostructured metal oxides and salts
EA Trusova, NS Trutnev – Beilstein Journal of Nanotechnology, 2018
… wt %, respectively. The NiO nanopowder was characterized by X-ray photoelectron
spectroscopy (XPS, PHI5500 Versa Probe II) with a monochromatic Al Kα X-ray source
(hν = 1486.6 eV, 50 W). Results and Discussion. Figure 2 …
A Cruz-Aguilar, D Navarro-Rodríguez… – Materials Today …, 2018
… objective and 532 nm laser. X-ray photoelectron spectroscopy (XPS) was carried out
in a spectrometer from PHI (VersaProbe II), using a monochromatic Al Kα radiation
with energy of 1486.6 eV. Survey spectra and high resolution …
Direct Decomposition of Nitrous Oxide Using Yb2O3-Pr6O11 with C-type Cubic Structure
CM Cho, Y Watanabe, N Nunotani, N Imanaka – Chemistry Letters, 2018
… The chemical composition of the catalysts was 92 identified by X-ray fluorescence (XRF;
Supermini200, 93 Rigaku). X-ray photoelectron spectroscopy (XPS; PHI 5000 94
VersaProbe II, ULVAC-PHI) was performed at room 95 temperature using Al Kα radiation …
Solution-processed ZnO thin-film transistors codoped with Na and F
M Kumar, H Jeong, D Lee – Journal of Materials Science: Materials in Electronics, 2018
… The chemical composition of the films was determined by X-ray photoelectron
spectroscopy (XPS) (PHI 5000 VersaProbe III). Current–voltage (I–V)
measurements were performed by using a semiconductor analyzer (Keithley …
Y Yang, Y Shi, G Yao, L Yu, W She – Materials Research Express, 2018
… Accepted Manuscript Page 5. photoelectron spectra (XPS) were collected with a
PHI-5000 VersaProbe X-ray photoelectron spectrometer with an Al Kα X-ray radiation.
The microstructural properties were obtained using scanning …
J Zhou, X Zhou, L Li, Q Chen – Applied Catalysis A: General, 2018
… The X-ray photoelectron spectroscopy (XPS) was tested by a PHI5000
VersaProbe equipped with a monochromatized Al Ka excitation source
(hv = 1486.6 eV) (ULVAC-PHI, Japan). The C 1 s peak (284.6 eV) was …
X Feng, P Wang, J Hou, J Qian, C Wang, Y Ao – Chemical Engineering Journal, 2018
… 200 kV. The surface elemental compositions of samples was obtained by XPS
(PHI 5000 VersaProbe). The X-band electron paramagnetic resonance (EPR) spectra
was used to investigate the defect state of samples. It was …
N Hao, Y Wei, J Wang, Z Wang, Z Zhu, S Zhao, M Han… – RSC Advances, 2018
… The elemental analysis and oxidation state study of the samples were carried
out by X-ray photoelectron spectroscopy (XPS, PHI 5000 VersaProbe),
and the binding energies were corrected for specimen charging effects …
YW Chen, YF Shen, CC Ho, J Yu, YHA Wu, K Wang… – Materials Science and …, 2018
… Then, the N compositions of the PDACS/PCL scaffolds were characterized with an electron
spectroscope for chemical analysis (ESCA, PHI 5000 VersaProbe, ULVAC-PHI, Kanagawa,
Japan). The water contact angle for each scaffold was determined at room temperature …
P Shukla, JK Shukla – Journal of Superconductivity and Novel Magnetism, 2018
… The surface morphology was studied using field emis- sion scanning electron microscope
(FESEM) using the on ZEISS, JSM-5800 model. X-ray photoelectron spec- troscopy (XPS)
was employed for surface composition, using a PHI5000 Versa probe system …
M He, J Zhang, H Wang, Y Kong, Y Xiao, W Xu – Nanoscale Research Letters, 2018
… The X-ray photoelectron spectroscopy (XPS) spectra were recorded by PHI5000 Versa
Probe II photoelectron spectrometer with Al Kα at 1486.6 eV. Results and Discussions.
The transmission electron microscope (TEM) images of CQDs are shown in Fig …
KV Manukyan, AV Yeghishyan, V Danghyan… – International Journal of …, 2018
… X-ray photoelectron spectroscopy (XPS) measurements were carried out in a PHI
VersaProbe II spectrometer with an Al Kα X-ray source operating at 1486.6 eV and a 90°
take-off angle for near-surface analysis of C 1s, Ni 2p 3/2 , and O 1s electronic transitions …
B Zhang, S Wang, L Fu, J Zhao, L Zhang, J Peng – Water, Air, & Soil Pollution, 2018
… The FTIR were tested under the conditions: potassium bromide pellets,
scanning 32 times, resolution 4 cm −1 . The XPS spectra are collected on
PHI5000 Versaprobe-II (Physical Electronics, Inc., Chanhassen, MN, USA) …
Resistive switching and magnetism in transparent a-TiO x films deposited by magnetron sputtering
S Ren, L Tang, Q Sun, Z Li, H Yang, W Chen – Journal of Alloys and Compounds, 2018
… 0.15406 nm). The elemental composition and the chemical states were measured
using X-ray photoelectron spectroscopy (XPS, PHI5000 Versa Probe) with
monochromatic Al Kα radiation (1486.6 eV) as the X-ray source. The …
R Ravindranath, AP Periasamy, P Roy, YW Chen… – Analytical and Bioanalytical …, 2018
… X-ray photoelectron spectroscopy (XPS) was performed using PHI 5000
VersaProbe (Physical Electronics, Eden Prairie, MN, USA). An Agilent 7700
ICP-MS system (Santa Clara, CA, USA) was used for the determination of …
Q Wang, W Yang, F Kang, B Li – Energy Storage Materials, 2018
… The stoichiometry of the as-synthesized compound was determined
measured by inductively coupled plasma atomic emission spectrometry
(ICP-AES).The X-ray photoelectron spectra (XPS) of the samples were …
Nanoporous metallic thin films prepared by dry processes
HT Tran, JY Byun, SH Kim – Journal of Alloys and Compounds, 2018
… solution. 2.5. Characterization. X-ray photoelectron spectroscopy (XPS) analysis was
conducted using a PHI 5000 VersaProbe (Ulvac-PHI) system. The measured binding
energies were calibrated by C1s line (284.6 eV). Morphologies …
J Xu, H Zhang, P Xu, R Wang, Y Tong, Q Lu, F Gao – Nanoscale, 2018
… The Raman spectra were collected with a Horiba LabRAM Aramis spectrometer using
a laser with a wavelength of 532 nm as the excitation source. XPS analysis was conducted
on a PHI-5000 Versa Probe X-ray photoelectron spectrometer using Al Kα X-ray source …
Tuning the dedoping process of PEDOT: PSS films using DBU-solvent complexes
M Reyes-Reyes, R López-Sandoval, E Tovar-Martínez… – Synthetic Metals, 2018
… Surface analysis by X-ray photon spectroscopy (XPS) was performed using
a Physical Electronics Ulvac Phi Versa Probe II spectrometer employing
an Al Kα (hν = 1486.6 eV) X-ray source operated at 15 kV and 25 W with …
Q Feng, S Wen, W Zhao, H Chen – Separation and Purification Technology, 2018
… taken as the final result. 2.6. XPS studies. XPS data were obtained using a PHI5000
Versa Probe II instrument (PHI5000, ULVAC-PHI, Japan) with an Al K α X-ray source
under ultra-high vacuum conditions. All elements in the …
KN Pandiyaraj, MC RamKumar, AA Kumar… – Journal of Physics and …, 2018
… The chemical compositions of the PEO-like coatings were studied using an XPS system
(PHI 5000 Versa probe II spectrometer) equipped with a monochromatic Al Kα X-ray source
(1486.7 eV), which operated at a power of 124 W to obtain both survey and high-resolution …
Two MOFs as dual-responsive photoluminescence sensors for metal and inorganic ions detection
ZJ Wang, FY Ge, G Sun, H Zheng – Dalton Transactions, 2018
… Luminescent spectra were recorded with a SHIMAZU VF-320 X-ray fluorescence
spectrophotometer at room temperature (25 °C). X-ray photoelectron spectroscopy (XPS)
measurement was obtained with a UlVAC-PHI 5000 VersaProbe …
Enhancing Low-Field Magnetoresistance in Magnetite Nanoparticles via Zinc Substitution
T Wang, ZZ Luan, JY Ge, L Liu, D Wu, ZP Lv, JL Zuo… – … Chemistry Chemical Physics, 2018
… X-ray photoelectron spectroscopy (XPS) was recorded on a PHI 5000
VersaProbe X-ray photoelectron spectrometer using standard and
monochromatic Al Kα radiation. The binding energy from the spectra were …
BJ Yao, JT Li, N Huang, J Kan, L Qiao, LG Ding, F Li… – ACS Applied Materials & …, 2018
… voltage of 120 kV on JEM-1400 electron microscope (JEOL). X-ray
photoelectron spectroscopy (XPS) were performed with a PHI 5000
Versaprobe II (VP-II) electron spectrometer (Ulvac-Phi) using 300W …
SH Yuan, SL Ou, CC Wang, SY Huang, CM Chen… – Japanese Journal of …, 2018
… Their transmittance spectra were analyzed using an n&k Technology
1280 with wavelengths ranging from 200 to 1000 nm. X-ray photoelectron
spectroscopy (XPS; ULVAC-PHI PHI 5000 VersaProbe) measurements …
Indium-Rich AgInS2-ZnS Quantum Dots–Ag: Zn Dependent Photophysics and Photovoltaics
SM Kobosko, PV Kamat – The Journal of Physical Chemistry C, 2018
… Instrumentation. Transmission electron microscopy (TEM) images were
obtained using an FEI Titan 80-300 system. A PHI VersaProbe II system
was used for XPS measurements. Steady state absorption measurements …
P Li, JY Hwang, SM Park, YK Sun – Journal of Materials Chemistry A, 2018
… The crystallinity of the as-made samples was determined by Raman analysis using a
Renishaw inVia Raman spectrometer. The chemical composition of the products was
analyzed by X-ray photoelectron spectroscopy (XPS, PHI5000 VersaProbe) …
A Nanostructured Anti-Reflective Iridium Oxide Coating for Water Oxidation
D Baker, M Graziano, B Hanrahan – The Journal of Physical Chemistry C, 2018
… a VÅNTEC-500 area detector. The chemical states of the sputtered IrOx surfaces
were analyzed with x-ray photoelectron spectroscopy (XPS) using a ULVAC-PHI
Versaprobe III calibrated with sputtered Ag and Au targets. A …
DM Driscoll, D Troya, PM Usov, AJ Maynes, AJ Morris… – The Journal of Physical …, 2018
… The UiO-66 sample was loaded in a platinum pan and heated at 2 deg/min under a flow
of air. XPS characterization was performed on a PHI VersaProbe III scanning XPS
microscope using monochromatic Al K-alpha X-ray source (1486.6 eV) …
G Rahman, SY Chae, O Joo – International Journal of Hydrogen Energy, 2018
… 450, HORIBA). X-ray photoelectron spectroscopy (XPS). For chemical analysis, the
XPS spectra of the NiS were obtained with PHI 5000 VersaProbe (Ulvac-PHI) under
high vacuum condition (6.8 × 10 −8 Pa). Monochromatic …
The Role of the Substrate on Photophysical Properties of Highly Ordered 15R-SiC Thin Films
S Mourya, J Jaiswal, G Malik, B Kumar, R Chandra – Journal of Electronic Materials, 2018
… To examine the elemental composition and electronic structure of the
15R-SiC thin films, x-ray photoelectron spectroscopy (XPS) measurements
were performed on a PHI Versa probe III electron spectrometer with the …
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