PI85

The PI 85L SEM PicoIndenter is the next-generation version of our dedicated in-situ nanomechanical test instrument, designed for use in SEM but suitable for a variety of platforms and environments.  Featuring Hysitron’s capacitive transducer working in conjunction with an extremely fast 78kHz control system, the system provides exceptional performance and superior stability at nanoscale.  The compact, low profile design makes the system ideally suited for small chamber SEMs, Raman and optical microscopes, beamlines, and more.

 

PI88

The PI 88 SEM PicoIndenter is Hysitron’s comprehensive in-situ nanomechanical test instrument for SEM and FIB/SEM.  Built upon Hysitron’s leading edge capacitive transducer technology, the PI 88 SEM PicoIndenter gives researchers an advanced instrument with powerful capabilities that delivers extraordinary performance and versatility.  The modular design also supports our full suite of testing techniques for future upgradability, now including 800°C heating, scratch testing, 5-axis sample positioning, electrical characterization, dynamic fatigue testing, and an interchangeable extended range (500mN, 150µm) transducer.

 

PI-95-TEMPI 95

The PI 95 TEM PicoIndenter from Hysitron, Inc. is the first full-fledged depth-sensing indenter capable of direct-observation nanomechanical testing in a transmission electron microscope (TEM). This pioneering in situ instrument is specifically designed to overcome the numerous configurational and environmental challenges presented by transmission electron microscopes, and its primary function is to output a quantitative force-displacement curve to be time correlated to the corresponding transmission electron microscope movie of the stress-induced deformation process. This coupling of high-resolution techniques enables a researcher to witness, for example, the microscopic origin of a measured force or displacement transient.