Terahertz near-field microscopy below 30nm spatial resolution

neaspec GmbH and Fraunhofer IPM have developed a ready-to-use terahertz system that is capable of achieving a spatial resolution of 30 nanometers in combination with neaspec’s near-field microscope – neaSNOM

Nano-imaging probes molecular disorder in organic semiconductors

Using nano-FTIR neaSNOM it could be shown that thin-film organic semiconductors contain regions of structural disorder. These could inhibit the transport of charge and limit the efficiency of organic electronic devices.

Ultrafast spectroscopy of electronic nano-motion in nanowires

The neaSNOM microscope equipped with a THz illumination unit were applied in ultrafast spectroscopy to take snapshots of super-fast electronic nano-motion. The scientists were able to record a 3D movie of electrons moving at the surface of a semiconductor nanowire.

Controlling Graphene plasmons with resonant antennas & conductivity patterns

neaspec’s neaSNOM microscope allows for launching and controlling light propagating along graphene, opening new venues for extremely miniaturized photonic devices and circuits

nano-FTIR probes secondary structure of single protein complexes

nano-FTIR beats the diffraction limit in infrared bio-spectroscopy and probes secondary structure in individual protein complexes

nano-FTIR – Nanoscale Infrared Spectroscopy at 20nm spatial resolution

neaSNOM/nano-FTIR allows infrared spectroscopy with a broadband laser-source at a spatial resolution of 20nm that is up to 1000-times better than in conventional FT-IR infrared spectroscopy.

Plasmon Mapping on Graphene with neaSNOM

Two independent research teams have successfully used their neaSNOM infrared near-field microscopes for laying down a ghost: visualizing Dirac plasmons propagating along graphene, for the first time.

Mapping local conductivity in semiconductor devices

Near-field microscopy at infared and terahertz frequencies allows to quantify free carrier properties at the nanoscale without the need of electrical contacts.

Identification of materials in semiconductor devices

Based on their unique near-field spectral signature infrared-active materials can be identified with neaSNOM.

Mapping optical fields of resonant particles

Near-field imaging of resonant gold nanodiscs reveals a dipolar oscillation mode.

Chemical characterization of polymer blends

Near-field images of a polymer blend made of Polystyrene (PS) and Poly (methyl methacrylate) (PMMA) reveal the nanostructured phase separation of the materials.

Characterization of optical surface waves

Infrared near-field microscopy allows to study the propagation of surface waves in the infrared spectral regime. Amplitude and phase resolved near-field images reveal local interference effects or enable the determination of the complex wave vector of surface waves. Surface waves can be excited in the mid-infrared spectral regime by e.g. metal structures on Silicon Carbide…

Studying superlensing and meta-materials

Direct verification of superlensing can be achieved by near-field microscopy as the local field transmitted by a superlens can be investigated in the near-field of the lens.

Infrared nanofocusing on transmission lines

Direct visualization of infrared light transportation and nanofocusing by miniature transmission lines is possible by amplitude- and phase-resolved near-field microscopy.

Analyzing optical nano-antennas

Amplitude and phase resolved near-field mapping of the local field distribution on resonant IR antennas can be used to analyze the antenna design and its functionality.

Nanoscale phase transitions

The high spatial resolution of infrared near-field microscopy allows for detailed studies of phase transitions in materials like the insulator-to-metal transition of vanadium dioxide (VO2) thin films.

Non-invasive imaging of stress/strain fields

Mapping nanoscale stress/strain fields around nanoindents in the surface of Silicon Carbide (SiC) crystals. Compressive/tensile strain occurs in bright/dark contrast respectively.

Investigating local conductivity of semiconductor nanowires

The local conductivity of nanowires can be investigated by infrared near-field microscopy.

Studying single viruses

Recording “fingerprint” spectra of single viruses and polymer nanobeads allows for identification of individual particles.

Spectroscopic indentification of materials

neaSNOM enables spectroscopic identification of materials at the nanometer scale.

Chemical nano identificationIRNano SpectroscopySemiconductors

nano-FTIR – Nanoscale Infrared Spectroscopy with a thermal source

neaSNOM/nano-FTIR allows infrared spectroscpy with a thermal source at a spatial resolution of 100nm that is up to 200 times better than in conventional FT-IR infrared spectroscopy.