neaspec GmbH and Fraunhofer IPM have developed a ready-to-use terahertz system that is capable of achieving a spatial resolution of 30 nanometers in combination with neaspec’s near-field microscope – neaSNOM
Using nano-FTIR neaSNOM it could be shown that thin-film organic semiconductors contain regions of structural disorder. These could inhibit the transport of charge and limit the efficiency of organic electronic devices.
The neaSNOM microscope equipped with a THz illumination unit were applied in ultrafast spectroscopy to take snapshots of super-fast electronic nano-motion. The scientists were able to record a 3D movie of electrons moving at the surface of a semiconductor nanowire.
neaspec’s neaSNOM microscope allows for launching and controlling light propagating along graphene, opening new venues for extremely miniaturized photonic devices and circuits
nano-FTIR beats the diffraction limit in infrared bio-spectroscopy and probes secondary structure in individual protein complexes
neaSNOM/nano-FTIR allows infrared spectroscopy with a broadband laser-source at a spatial resolution of 20nm that is up to 1000-times better than in conventional FT-IR infrared spectroscopy.
Two independent research teams have successfully used their neaSNOM infrared near-field microscopes for laying down a ghost: visualizing Dirac plasmons propagating along graphene, for the first time.
Near-field microscopy at infared and terahertz frequencies allows to quantify free carrier properties at the nanoscale without the need of electrical contacts.
Based on their unique near-field spectral signature infrared-active materials can be identified with neaSNOM.
Near-field imaging of resonant gold nanodiscs reveals a dipolar oscillation mode.
Near-field images of a polymer blend made of Polystyrene (PS) and Poly (methyl methacrylate) (PMMA) reveal the nanostructured phase separation of the materials.
Infrared near-field microscopy allows to study the propagation of surface waves in the infrared spectral regime. Amplitude and phase resolved near-field images reveal local interference effects or enable the determination of the complex wave vector of surface waves. Surface waves can be excited in the mid-infrared spectral regime by e.g. metal structures on Silicon Carbide…
Direct verification of superlensing can be achieved by near-field microscopy as the local field transmitted by a superlens can be investigated in the near-field of the lens.
Direct visualization of infrared light transportation and nanofocusing by miniature transmission lines is possible by amplitude- and phase-resolved near-field microscopy.
Amplitude and phase resolved near-field mapping of the local field distribution on resonant IR antennas can be used to analyze the antenna design and its functionality.
The high spatial resolution of infrared near-field microscopy allows for detailed studies of phase transitions in materials like the insulator-to-metal transition of vanadium dioxide (VO2) thin films.
Mapping nanoscale stress/strain fields around nanoindents in the surface of Silicon Carbide (SiC) crystals. Compressive/tensile strain occurs in bright/dark contrast respectively.
The local conductivity of nanowires can be investigated by infrared near-field microscopy.
Recording “fingerprint” spectra of single viruses and polymer nanobeads allows for identification of individual particles.
neaSNOM enables spectroscopic identification of materials at the nanometer scale.
neaSNOM/nano-FTIR allows infrared spectroscpy with a thermal source at a spatial resolution of 100nm that is up to 200 times better than in conventional FT-IR infrared spectroscopy.