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  • Electron Microscopy
    • - In Situ Measurements in TEM
    • - Probestation for SEM
    • - Micromanipulators
    • - Other Accesories for Electron Microscopy
    • - Anti-vibration systems for SEM/TEM
    • - Noise Reduction Boxes for SEM/TEM
    • - Electronic Microscopy Consumables
  • Characterization
    • - Raman
    • - Auger Spectroscopy
    • - XPS
    • - TOF-SIMS
    • - Accesories
  • Nano-Fabricación
    • - Nanolitografía
    • - Laser Beam Lithography (LBL)
    • - Deposicionador de Capas Finas – Thin Film Deposition
  • Componentes
    • - Cámaras
    • - LEDS
  • News
Irida Ibérica
  • Electron Microscopy
    • In Situ Measurements in TEM
    • Probestation for SEM
    • Micromanipulators
    • Other Accesories for Electron Microscopy
    • Anti-vibration systems for SEM/TEM
    • Noise Reduction Boxes for SEM/TEM
    • Electronic Microscopy Consumables
  • Characterization
    • Raman
    • Auger Spectroscopy
    • XPS
    • TOF-SIMS
    • Accesories
  • Nano-Fabricación
    • Nanolitografía
    • Laser Beam Lithography (LBL)
    • Deposicionador de Capas Finas – Thin Film Deposition
  • Componentes
    • Cámaras
    • LEDS
  • News
Home / Blog

Blog

(Español) MiniLab Systems Proven for High-Quality Optical Film R&D

Sorry, this entry is only available in European Spanish.

(Español) el AFM con control ambiental es más fácil de lo que crees

Sorry, this entry is only available in European Spanish.

(Español) Mejora de las baterías de iones de litio: Medición de la fricción de los aglutinantes de polímero

Sorry, this entry is only available in European Spanish.

(Español) SÍGUENOS EN NUESTRO CANAL DE YOUTUBE

Sorry, this entry is only available in European Spanish.

(Español) Vídeo del Webinar Traer su experimento dentro de un microscopio electrónico

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(Español) Vídeo del Webinar Análisis de capas finas con rayos-x duros y blandos, en tu laboratorio

Sorry, this entry is only available in European Spanish.

(Español) Enlace Webinar TECNICAS AVANZADAS EN MICROSCOPIA RAMAN

Sorry, this entry is only available in European Spanish.

(Español) Webinar: Trae tu experimento dentro del microscopio electrónico (TEM y SEM)

Sorry, this entry is only available in European Spanish.

(Español) Webinar Análisis de capas finas con rayos-x duros y blandos, en tu laboratorio

Sorry, this entry is only available in European Spanish.

(Español) Técnicas avanzadas en microscopia Raman. El futuro está aquí

Sorry, this entry is only available in European Spanish.

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Irida Ibérica, S.L 2021
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