Film Thickness Measurements are one of the most challenging and critical metrics in any coating process. Destructive testing can be used to measure the thickness of a film from a cross-section, however (besides the undesirability of a broken product), the method of breakage may impact the measurement (a cutting tool may compress it, a […]
” Zoom zoom: High speed AFM imagin
C Parmenter on 06 February, 2017.
Trending M&A blog posts
The Focused Ion Beam – All Grown Up?
Is your sample preparation holding you back? by Chris Parmenter
Desktop EM – here to stay for good?
Translating two dimensions into three dimensions
Cryomicroscopy – just getting warmed up!
Imaging with an […]
” Published on February 6, 2017 at 4:23 AM
Written by AZoNanoFeb 6 2017
Oxford Instruments Asylum Research announces the new Cypher VRS Video-Rate AFM, the first and only full-featured video-rate atomic force microscope (AFM). The Cypher VRS sets a new benchmark for speed, enabling high resolution imaging of dynamic events at up to 625 lines/second, […]