February 2017

Thin Film Thickness / Spectrometer

By |February 22nd, 2017|

Film Thickness Measurements are one of the most challenging and critical metrics in any coating process. Destructive testing can be used to measure the thickness of a film from a cross-section, however (besides the undesirability of a broken product), the method of breakage may impact the measurement (a cutting tool may compress it, a […]

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Zoom zoom: High speed AFM imaging

By |February 20th, 2017|

” Zoom zoom: High speed AFM imagin

 
 

C Parmenter on 06 February, 2017.

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Oxford Instruments Asylum Research Announces the New Cypher VRS Video-Rate Atomic Force Microscope

By |February 20th, 2017|

 
” Published on February 6, 2017 at 4:23 AM

Written by AZoNanoFeb 6 2017
Oxford Instruments Asylum Research announces the new Cypher VRS Video-Rate AFM, the first and only full-featured video-rate atomic force microscope (AFM). The Cypher VRS sets a new benchmark for speed, enabling high resolution imaging of dynamic events at up to 625 lines/second, […]

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