General AFM/SPM Technology

AFM Characterization of Thin Films: High-Resolution Topography and Functional Properties

Measuring Surface Roughness with Atomic Force Microscopy

Low Noise Cantilevers for AC in Fluid and Force Measurements

AFM Equation Card

Digital Q Control

Digital Lock-in

Band Excitation Scanning Probe Microscopies

Cantilever Calibration

Bimodal Dual AC Mode


Electrical Measurements

Scanning Microwave Impedance Microscopy (sMIM)

Piezoresponse Force Microscopy

Photoconductivity AFM of Organic Photovoltaics

SPM Techniques for Organic Photovoltaics

Electrochemical Strain Microscopy of Li-ion Conductive Materials for Energy Generation and Storage

ORCA™ – Conductive AFM Imaging Using the MFP-3D

Overview of AFM Tools for Electrical Characterization

Graphene and other low-dimensional materials



AFM and Combined Optical Techniques

Stretching DNA with the MFP-1D

Drug Research

Titin Measurements with the MFP-1D

Simultaneous AFM and Fluorescence Measurements with the MFP-3D

Bimodal Dual AC™ Imaging of Collagen Fiber Ultrastructure

Simultaneous Atomic Force and Phase Contrast Microscopy

Crack Propagation in Bone

Utilizing Atomic Force Microscopy in Food Research

BlueDrive™ for Cypher



Contact Resonance Viscoelastic Mapping Mode

AM-FM Viscoelastic Mapping of Sample Mechanical Properties

The NanomechPro™ Toolkit: Nanomechanical AFM Techniques for Diverse Materials

Force Scanning with the MFP-3D™ AFMs: Two Capabilities In One

Force Spectroscopy of Oil Droplet Interactions

MFP NanoIndenter for Combined AFM and Instrumented Nanoindentation



AFM Applications in Polymer Science and Engineering

Ztherm™ Modulated Thermal Analysis

Copolymer Stretching


Nanolithography and Nanomanipulation

Engineering Nanoelectronic Devices

MicroAngelo™ – Built-in Nanolithography and Manipulation



AFM Automation with MacroBuilder™

GetReal™ Automated Probe Calibration